5962-8873504LA QP SEMICONDUCTOR, 5962-8873504LA Datasheet - Page 12

• Manufacturer Part Number: 5962-8873504LA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8873504LA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
NOTES:
1. Ensure that adequate decoupling capacitance is employed across the device V
2. Do not leave any input disconnected (floating) during any tests.
3. Do not attempt to perform threshold tests under ac conditions. Large amplitude fast ground current transients
4. Output levels are measured at 1.5 V reference levels.
5. Transition is measured at steady-state high level –500 mV or steady-state low level +500 mV on output from the 1.5
6. Tests are performed with rise and fall times of 5 ns or less.
7. See above waveform for t
8. All device test loads should be located within two inches of device outputs.
DEFENSE SUPPLY CENTER COLUMBUS
capacitors are recommended, including a 0.1 µF or larger capacitor and a 0.01 µF or smaller capacitor, placed as
close to the device terminals as possible. Inadequate decoupling may result in large variations of power supply
voltage, creating erroneous function or transient performance failures.
normally occur as the device outputs discharge the load capacitances. These transients flowing through the parasitic
inductance between the device ground pin and the test system ground can create significant reductions in observable
input noise immunity.
V level on inputs with load shown on figure 3.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
HZC
and t
FIGURE 4. Switching waveforms - Continued.
HZE
.
SIZE
A
REVISION LEVEL
CC
and ground terminals. Multiple
E
SHEET
5962-88735
12