5962-8873504LA QP SEMICONDUCTOR, 5962-8873504LA Datasheet - Page 6

• Manufacturer Part Number: 5962-8873504LA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8873504LA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
Input leakage current
Output leakage current
Operating supply current
Input low voltage 2/
Input high voltage 2/
Output low voltage
Output high voltage
Output short circuit
Input capacitance 4/
Output capacitance 4/
Address setup to clock
Address hold from clock
See footnotes at end of table.
(active)
Current 3/ 4/
high
high
1/
DEFENSE SUPPLY CENTER COLUMBUS
Test
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
I
I
I
V
V
V
V
I
C
C
t
t
Symbol
LI
LO
CC
OS
SA
HA
IL
IH
OL
OH
IN
OUT
V
V
output disabled
addresses cycling between
0 V and 3 V; f =
V
V
I
V
I
V
V
V
f = 1.0 MHz, T
see 4.3.1c
V
f = 1.0 MHz, T
see 4.3.1c
See figures 3 and 4
E / E
OL
OH
IN
OUT
CC
CC
IL
IL
O
IN
OUT
TABLE I. Electrical performance characteristics.
= 16 mA, V
= 0.8 V, V
= 0.8 V, V
= GND
= -4 mA, V
= 5.5 V and GND
= 0 V, V
unless otherwise specified
= 4.5 V and 5.5 V
= 4.5 V and 5.5 V
S
= 5.5 V and GND
= 0 V, V
4.5 V ≤ V
= V
-55°C ≤ T
IL
GND = 0 V
CC
Conditions
, INIT = V
IH
IH
CC
CC
C
C
CC
= 5.5 V,
= 2.0 V
= 2.0 V
CC
= +25°C,
= +25°C,
= 5.5 V,
C
t 2
= 4.5 V
= 4.5 V
≤+125°C
= ≤ 5.5 V
PWC
1
IH
SIZE
A
subgroups
9, 10, 11
9, 10, 11
Group A
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
4
4
REVISION LEVEL
Device
02, 03
types
All
All
All
All
All
All
All
All
All
All
01
04
All
E
Min
-20
45
35
25
0
2.0
2.4
Limits
SHEET
-125
Max
120
±10
±40
5962-88735
0.8
0.4
10
10
6
Unit
mA
mA
µA
µA
pF
pF
ns
ns
V
V
V
V