8200804LA QP SEMICONDUCTOR, 8200804LA Datasheet - Page 7

• Manufacturer Part Number: 8200804LA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 8200804LA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
Notes:
1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent tests
2. C
3. Outputs may be under load simultaneously.
4. V
which apply to the specific program configuration of the resulting read-only memory.
OLAC
L
DEFENSE SUPPLY CENTER COLUMBUS
= 30 pF minimum, including jig and probe capacitance: R
and V
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
OHAC
STANDARD
are the measured output voltage levels while enabled.
FIGURE 3. Switching time test circuits and waveforms.
Circuit F
1
= 300Ω and R
SIZE
A
2
REVISION LEVEL
= 600Ω.
K
SHEET
82008
7