8200804LA QP SEMICONDUCTOR, 8200804LA Datasheet
8200804LA
Specifications of 8200804LA
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8200804LA Summary of contents
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... OH OH max. limit from pF; change IN test column. Removed logic diagrams MICROCIRCUIT, MEMORY, DIGITAL, SCHOTTY BIPOLAR 32K PROGRAMMABLE READ ONLY MEMORY (PROM), MONOLITHIC SILICON 82-09-01 SIZE K A SHEET DATE (YR-MO-DA) 91-10- Frye 93-02- Frye 93-08- Frye 97-05-29 = -2.0 Raymond Monnin 05-06-30 Raymond Monnin ...
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... J Case outline (see 1.2.2) Circuit function 4096 words x 8 bits per word PROM, T.S. 4096 words x 8 bits per word PROM, T.S. 4096 words x 8 bits per word PROM, T.S. 4096 words x 8 bits per word PROM, T.S. Terminals ............................................ ...
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APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation ...
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Test Symbol High level output voltage Low level output voltage Input clamp voltage High impedance I V OHZ (Off-state) output high current High impedance I V OLZ (Off-state) output low current ...
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Device Types Case Outlines Terminal Number STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR Terminal Symbol ...
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Word number Notes Not applicable Input may be high level, low level, or open ...
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Notes: 1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent tests which apply to the specific program configuration of the resulting read-only memory minimum, including ...
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FIGURE 3. Switching time test circuits and waveforms – Continued. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Circuit F Continued SIZE A REVISION LEVEL 82008 SHEET K 8 ...
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Note 270Ω and R = 600Ω FIGURE 3. Switching time test circuits and waveforms – Continued. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Circuit ...
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FIGURE 3. Switching time test circuits and waveforms – Continued. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Circuit C Continued SIZE A REVISION LEVEL 82008 SHEET K 10 ...
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Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups ...
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MIL-STD-883 test requirements Interim electrical parameters (method 5004) Final electrical test parameters (method 5004) for unprogrammed devices Final electrical test parameters (method 5004) for programmed devices Group A test requirements (method 5005) Groups C and D end-point electrical parameters (method ...
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Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition The test circuit shall be ...
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STANDARD MICROCIRCUIT DRAWING BULLETIN Approved sources of supply for SMD 82008are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the addition ...
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... Military drawing and DSCC drawing PINs formerly had a programming procedure letter within the military drawing PIN: these parts are interchangeable with parts that are now marked without the programming procedure letter within the military drawing number, i ...