8200804LA QP SEMICONDUCTOR, 8200804LA Datasheet - Page 12

• Manufacturer Part Number: 8200804LA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 8200804LA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
4.3.1 Group A inspection.
a.
b.
c.
d.
e.
(1)
(2)
DEFENSE SUPPLY CENTER COLUMBUS
Tests shall be as specified in table II herein.
Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
Subgroup 4 (C
changes which may affect input or output capacitance. Sample size is 15 devices with no failures, and all input and
output terminals tested.
Unprogrammed devices shall be tested for programmability and ac performance compliance to the requirements of
group A, subgroup 9,10,11. Either of two techniques is acceptable:
Subgroups 7 and 8 shall include verification of the truth table.
MICROCIRCUIT DRAWING
Testing the entire lot using additional built-in test circuitry which allows the manufacturer to verify programmability
and ac performance without programming the user array. If this is done, the resulting test patterns shall be verified
on all devices during subgroup 9,10,11 group A testing in accordance with the sampling plan specified in
MIL-STD-883, method 5005.
If such compliance cannot be tested on an unprogrammed device, a sample shall be selected to satisfy
programmability requirements prior to performing subgroup 9,10,11. Twelve devices shall be submitted to
programming (see 3.2.2.1). If more than two devices fail to program, the lot shall be rejected. At the
manufacturer's option, the sample may be increased to 24 total devices with no more than four total device failures
allowable.
Ten devices from the programmability sample shall be submitted to the requirements of group A, subgroup
9,10,11. If more than two total devices fail, the lot shall be rejected. At the manufacturer's option, the sample may
be increased to 20 total devices with no more than four total device failures allowable.
COLUMBUS, OHIO 43218-3990
1/
2/
3/
STANDARD
IN
Interim electrical parameters
Final electrical test parameters (method 5004)
for unprogrammed devices
Final electrical test parameters (method 5004)
for programmed devices
Group A test requirements (method 5005)
Groups C and D end-point electrical
parameters (method 5005)
and C
(method 5004)
* Indicates PDA applies to subgroups 1 and 7.
Any or all subgroups may be combined when using high-speed testers.
Subgroups 7 and 8 shall consist of verifying the pattern specified.
OUT
MIL-STD-883 test requirements
measurements) shall be measured only for the initial test and after process or design
TABLE II. Electrical test requirements. 1/ 2/ 3/
SIZE
A
MIL-STD-883, method
(in accordance with
1*, 2, 3, 7*, 8A, 8B
1, 2, 3, 7, 8A, 8B
1, 2, 3, 4, 7, 8A,
1*, 2, 3, 7*, 8A,
REVISION LEVEL
5005, table I)
8B, 9, 10, 11
Subgroups
8B, 9
- - -
K
SHEET
82008
12