8200804LA QP SEMICONDUCTOR, 8200804LA Datasheet - Page 4

• Manufacturer Part Number: 8200804LA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 8200804LA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
1/ Not more than one output shall be grounded at one time, for a maximum of 1 second.
2/ C
3/ May not be tested but is guaranteed to the limits specified in table I.
High level output
Low level output
Input clamp voltage
High impedance
(Off-state) output
high current
High impedance
(Off-state) output
low current
High level input
Low level input
Short circuit output
Supply current
Input capacitance
Output capacitance
Address access
time
Chip enable access
time
Chip disable access
time
voltage
voltage
current
current
current
L
2/
≥ 5 pF.
Test
DEFENSE SUPPLY CENTER COLUMBUS
3/
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
V
V
V
I
I
I
I
I
I
C
C
t
t
t
Symbol
OHZ
OLZ
IH
IL
OS
CC
AA
EA
DA
OH
OL
IC
IN
OUT
V
V
I
V
V
V
V
V
V
V
inputs grounded
V
V
V
V
V
see figure 4
unless otherwise specified
I
I
IN
V
V
OH
OL
CC
CC
CC
CC
IH
IL
CC
OUT
CC
CC
IN
CC
OUT
CC
O
O
= -18 mA
= 0.4 V
-55°C ≤ T
= V
= 2.0 V, see 4.3.1c
V
= 16mA
= 2.4 V
= 0.4 V
TABLE I. Electrical performance characteristics.
= -1.6 mA
= minimum,
= minimum,
= V
= V
= V
= V
= 5 V, f = 1 MHz,
= 5 V, f = 1 MHz,
= 4.5 V and 5.5 V,
CC
= 0.2 V
= 2.0 V, see 4.3.1c
CC
CC
CC
CC
CC
= 4.5 V to 5.5 V
Conditions
maximum
maximum
maximum, all
maximum
maximum
C
≤ +125°C
1/
01, 02, 04
02, 03, 04
02,03,04
02,03,04
Device
01, 04
02, 03
type
SIZE
All
All
All
01
01
All
All
All
All
All
03
01
02
03
04
01
A
subgroups
9, 10, 11
Group A
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
REVISION LEVEL
4
4
K
Min
-15
2.4
Limits
SHEET
-100
-250
-100
Max
-1.5
100
190
-40
0.5
40
40
15
20
12
95
55
45
70
45
35
45
35
82008
4
Unit
mA
mA
µA
µA
µA
µA
pF
pF
ns
ns
ns
V
V
V