M38510/20702BEA QP SEMICONDUCTOR, M38510/20702BEA Datasheet - Page 3

• Manufacturer Part Number: M38510/20702BEA
• Manufacturer: QP SEMICONDUCTOR

Specifications of M38510/20702BEA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

either the manufacturer or the user to result in a wide variety of PROM configurations, two processing options are
provided for selection in the contract, using an altered item drawing.
defined in 3.3.2.1, table II, and table III. It is recommended that users perform subgroups 7 and 9 after
programming to verify the specific program configuration.
provisions herein, including the requirements of the altered item drawing, shall be satisfied by the manufacturer
prior to delivery.
number 14 (see Appendix A MIL-PRF-38535.)
cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes
applicable laws and regulations unless a specific exemption has been obtained.
a manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before
contract award (see 4.3 and 6.3).
as specified herein or as modified in the device manufacturer’s Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein.
be as specified in MIL-PRF-38535 and herein.
item drawing shall be as specified on figure 2. When required in groups A, B, or C inspection (see 4.4), the
devices shall be programmed by the manufacturer prior to test in a checkerboard pattern (a minimum of 50
percent of the total number of bits programmed) or to any altered item drawing pattern which includes at least 25
percent of the total number of bits programmed.
item drawing.
6.6).
characteristics are as specified in table I, and apply over the full recommended case operating temperature
range.
subgroups specified in table II. The electrical tests for each subgroup are described in table III.
3.8
3.8.1 Unprogrammed PROM delivered to the user. All testing shall be verified through group A testing as
3.8.2 Manufacture-programmed PROM delivered to the user. All testing requirements and quality assurance
3.9
2.3 Order of precedence. In the event of a conflict between the text of this specification and the references
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by
3.2 Item requirements.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall
3.3.1 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3.2 Truth tables.
3.3.2.1 Unprogrammed devices. The truth table for unprogrammed devices for contracts involving no altered
3.3.2.2 Programmed devices. The truth table for programmed devices shall be as specified by the altered
3.3.3 Functional block diagram. The functional block diagram shall be as specified on figure 3.
3.3.4 Case outlines. The case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see
3.5 Electrical performance characteristics. Unless otherwise specified, the electrical performance
3.6 Electrical test requirements. The electrical test requirements for each device class shall be the
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
Processing options. Since the PROM is an unprogrammed device capable of being programmed by
Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group
The individual item requirements shall be in accordance with MIL-PRF-38535 and
MIL-M-38510/207E
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