BLF4G10-160,112 NXP Semiconductors, BLF4G10-160,112 Datasheet - Page 6

TRANSISTOR RF LDMOS SOT502A

BLF4G10-160,112

Manufacturer Part Number
BLF4G10-160,112
Description
TRANSISTOR RF LDMOS SOT502A
Manufacturer
NXP Semiconductors
Datasheets

Specifications of BLF4G10-160,112

Package / Case
SOT502A
Transistor Type
LDMOS
Frequency
894MHz
Gain
19.7dB
Voltage - Rated
65V
Current Rating
15A
Current - Test
900mA
Voltage - Test
28V
Power - Output
160W
Configuration
Single
Transistor Polarity
N-Channel
Resistance Drain-source Rds (on)
0.065 Ohms
Drain-source Breakdown Voltage
65 V
Gate-source Breakdown Voltage
15 V
Continuous Drain Current
15 A
Maximum Operating Temperature
+ 200 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 65 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Noise Figure
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
934058737112
BLF4G10-160
BLF4G10-160
NXP Semiconductors
BLF4G10-160_1
Product data sheet
Fig 9. CDMA power gain and drain efficiency as
Fig 11. CDMA ACPR at 750 kHz and at 1980 kHz as functions of average load power; typical values, measured in a
(dB)
G
p
20
19
18
17
16
V
Test signal: IS-95 with PAR = 9.9 dB at 0.01 %
probability.
functions of average load power; typical values,
measured in a CDMA demo test circuit
V
CDMA demo test circuit
28
DS
DS
= 28 V; I
= 28 V; I
32
Dq
Dq
= 1100 mA; f = 881.5 MHz.
= 1100 mA; T
36
G
D
p
40
ACPR
case
(dBc)
35
45
55
65
75
= 25 C; f = 881.5 MHz.
28
P
44
L(AV)
001aag554
(dBm)
32
48
Rev. 01 — 22 June 2007
40
30
20
10
0
ACPR
ACPR
(%)
D
1980
36
750
Fig 10. CDMA power gain as a function of average load
40
(dB)
(1) f = 869 MHz.
(2) f = 881.5 MHz.
(3) f = 894 MHz.
G
p
20
19
18
17
16
V
power at various frequencies; typical values,
measured in a CDMA demo test circuit
28
DS
P
44
L(AV)
001aag556
= 28 V; I
(dBm)
32
48
1
2
3
Dq
= 1100 mA.
36
UHF power LDMOS transistor
BLF4G10-160
40
© NXP B.V. 2007. All rights reserved.
P
44
L(AV)
001aag555
(dBm)
48
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