BLF6G10LS-200R,112 NXP Semiconductors, BLF6G10LS-200R,112 Datasheet - Page 5

IC BASESTATION FINAL SOT502B

BLF6G10LS-200R,112

Manufacturer Part Number
BLF6G10LS-200R,112
Description
IC BASESTATION FINAL SOT502B
Manufacturer
NXP Semiconductors
Datasheet

Specifications of BLF6G10LS-200R,112

Package / Case
SOT502B
Transistor Type
LDMOS
Frequency
871.5MHz
Gain
20dB
Voltage - Rated
65V
Current Rating
49A
Current - Test
1.4A
Voltage - Test
28V
Power - Output
40W
Configuration
Single
Transistor Polarity
N-Channel
Resistance Drain-source Rds (on)
0.06 Ohms
Drain-source Breakdown Voltage
65 V
Gate-source Breakdown Voltage
- 0.5 V to + 13 V
Continuous Drain Current
49 A
Maximum Operating Temperature
+ 225 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 65 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Noise Figure
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
934061248112
BLF6G10LS-200R
BLF6G10LS-200R
NXP Semiconductors
8. Test information
BLF6G10LS-200R_1
Preliminary data sheet
Fig 4. 2-carrier W-CDMA power gain and drain
Fig 6. Test circuit for operation at 800 MHz
input
50
(dB)
G
p
22
21
20
19
18
V
carrier spacing 10 MHz.
efficiency as functions of average load power;
typical values
The drawing is not to scale.
0
DS
G
= 28 V; I
D
p
7.4 2-carrier W-CDMA
Dq
V
GG
20
= 1400 mA; f = 881 MHz ( 5 MHz);
R1
C1
40
P
L(AV)
001aah521
C3
(W)
Rev. 01 — 21 January 2008
R2
C2
60
40
30
20
10
0
(%)
D
C7
C9
Fig 5. 2-carrier W-CDMA adjacent channel power ratio
IMD3,
ACPR
(dBc)
C8
C10
35
40
45
50
55
V
carrier spacing 10 MHz.
and third order intermodulation distortion as
functions of average load power; typical values
C5
C6
0
DS
C11
C12
= 28 V; I
C13
C14
IMD3
ACPR
BLF6G10LS-200R
Dq
20
= 1400 mA; f = 881 MHz ( 5 MHz);
C17
C18
R3
L1
Power LDMOS transistor
40
V
DD
P
L(AV)
© NXP B.V. 2008. All rights reserved.
C15
C16
001aah522
(W)
60
001aah523
output
50
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