GT15Q102(Q) Toshiba, GT15Q102(Q) Datasheet

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GT15Q102(Q)

Manufacturer Part Number
GT15Q102(Q)
Description
IGBT 1200V 15A TO-3PN
Manufacturer
Toshiba
Datasheet

Specifications of GT15Q102(Q)

Voltage - Collector Emitter Breakdown (max)
1200V
Vce(on) (max) @ Vge, Ic
2.7V @ 15V, 15A
Current - Collector (ic) (max)
15A
Power - Max
170W
Input Type
Standard
Mounting Type
Through Hole
Package / Case
*
Configuration
Single
Collector- Emitter Voltage Vceo Max
1200 V
Maximum Gate Emitter Voltage
20 V
Continuous Collector Current Ic Max
15 A
Mounting Style
Through Hole
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Igbt Type
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
High Power Switching Applications
Absolute Maximum Ratings
Marking
Third-generation IGBT
Enhancement mode type
High speed: t
Low saturation voltage: V
Collector-emitter voltage
Gate-emitter voltage
Collector current
Collector power dissipation
(Tc = 25°C)
Junction temperature
Storage temperature range
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Characteristic
GT15Q102
TOSHIBA
f
= 0.32 μs (max)
TOSHIBA Insulated Gate Bipolar Transistor Silicon N Channel IGBT
1 ms
CE (sat)
DC
Part No. (or abbreviation code)
Lot No.
A line indicates
lead (Pb)-free package or
lead (Pb)-free finish.
= 2.7 V (max)
(Ta = 25°C)
Symbol
V
V
GT15Q102
T
I
P
GES
CES
I
CP
T
stg
C
C
j
−55~150
Rating
1200
±20
170
150
15
30
1
Unit
°C
°C
W
V
V
A
Weight: 4.6 g
JEDEC
JEITA
TOSHIBA
2-16C1C
GT15Q102
2006-11-01
Unit: mm

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GT15Q102(Q) Summary of contents

Page 1

... Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc) ...

Page 2

Electrical Characteristics Characteristic Gate leakage current Collector cut-off current Gate-emitter cut-off voltage Collector-emitter saturation voltage Input capacitance Rise time Turn-on time Switching time Fall time Turn-off time Thermal resistance Note1: Switching time measurement circuit and input/output waveforms GT15Q301 −V GE ...

Page 3

I – Common emitter Tc = 25° Collector-emitter voltage V ( – Common ...

Page 4

Switching time – Common emitter 600 ± 25°C 0 125°C 0.1 0.05 ...

Page 5

C – 3000 1000 300 100 Common emitter MHz Tc = 25° 100 Collector-emitter voltage V CE Safe operating area 100 max ...

Page 6

... The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • ...

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