AD8340ACPZ-WP Analog Devices Inc, AD8340ACPZ-WP Datasheet - Page 15

• Manufacturer Part Number: AD8340ACPZ-WP
• Description: IC MOD VECT 700-1000MHZ 24-LFCSP
• Manufacturer: Analog Devices Inc

Specifications of AD8340ACPZ-WP

• Function: Vector, Modulator
• Lo Frequency: 700MHz ~ 1GHz
• Rf Frequency: 700MHz ~ 1GHz
• P1db: 11dBm
• Noise Floor: -149dBm/Hz
• Current - Supply: 150mA
• Voltage - Supply: 4.75 V ~ 5.25 V
• Test Frequency: 880MHz
• Package / Case: 24-VFQFN, CSP Exposed Pad
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Holding the I and Q control voltages steady at 0.353 V, input
power was swept. Figure 36 shows the resulting output power,
noise floor, and adjacent channel power ratio. Noise floor is
presented as noise in a 1 MHz bandwidth as defined by the
3GPP2 specification.
The results show that at an output power of 3 dBm, ACP is still
in compliance with the standard (<−45 dBc @ 750 MHz and
<−60 dBc @ 1.98 MHz). At low output power levels, ACP at
1.98 MHz, carrier offset degrades as the noise floor of the
AD8340 becomes the dominant contributor to measured ACP.
Measured noise at 4 MHz carrier offset begins to increase
sharply above 0 dBm output power. This increase is not due to noise.
but results from increased carrier-induced distortion. As output
power drops below 0 dBm, the noise floor drops towards −90 dBm.
With a fixed input power of 2.4 dBm, the output power was
again swept by exercising the I and Q inputs. V
kept equal and were swept from 10 mV to 500 mV. The
resulting output power, ACP, and noise floor are shown in
Figure 37.
Figure 35. Output Spectrum, Single-Carrier CDMA2000 Test Model at −5 dBm
ACP Measured in 30 kHz RBW at ±750 kHz and ±1.98 MHz Carrier Offset,
V
Noise Measured at ±4 MHz Carrier Offset, Input Signal Filtered Using a
I
–100
= V
–30
–40
–50
–60
–70
–80
–90
–110
–100
–90
–20
–30
–40
–50
–60
–70
–80
–30
Q
= 0.353 V, ACP Measured at 750 kHz and 1.98 MHz Carrier Offset,
BS, 1X, C0 : ADJ CHANNE L
REF –12dBm
CENTER 880MHz
Single-Carrier CDMA2000 Test Model, V
OFFSET 0.5 dB
SWP 50 OF 50
–25
2
Figure 36. Noise and ACP vs. Output Power,
Cavity Tuned Filter (Pass Band = 4.6 MHz)
Noise Measured at ±4 MHz Carrier Offset
ACP – 750kHz OFFSET, 30kHz RBW
NOISE – 4MHz OFFSET, 1MHz RBW
ACP – 1.98MHz OFFSET, 30kHz RBW
–20
OUTPUT POWER (dBm)
*ATT 5dB
–15
1MHz/DIV
*RBW 30kHz
*VBW 30kHz
*SWT 100ms
–10
CH PWR
ACP LOW
ACP UP
ALT1 LOW
ALT1 UP
–5
MARKER 1 [T1 NOI]
MARKER 2 [T1 NOI]
884.006410256MHz
I
= V
876.009615385MHz
–148.89dBm/Hz
–148.76dBm/Hz
Q
I
= 0.353,
SPAN 10MHz
0
and V
–5.17dBm
–60.94dB
–60.08dB
–86.40dB
–86.80dB
1
Q
5
–30
–40
–50
–60
–80
–100
were
–70
–90
LVL
NOR
Rev. B | Page 15 of 20
In contrast to Figure 36, Figure 37 shows that for a fixed input
power, ACP remains fairly constant as gain and phase are
changed (this is not true for very high input powers). The noise
floor still drops with decreasing gain, but it never reaches the
−90 dBm level shown in Figure 37.
Figure 38 shows the output spectrum for a 3-carrier CDMA2000
spectrum. Again, the signal being applied to the AD8340 is
filtered by a cavity-tuned filter with a −3 dB bandwidth of
4.6 MHz. To reduce distortion, the total output carrier power
was reduced to approximately −8 dBm (per-carrier power =
−12.6 dBm). Adjacent channel power ratios of −61 dBc (2 MHz
from center of spectrum) and −82 dBc (3.23 MHz from center
of spectrum) were measured. The noise floor, measured at
5.25 MHz carrier offset, is approximately −149 dBm/Hz (−89 dBm
in a 1 MHz bandwidth). While some dynamic range is lost due
to output power back-off, ACP stays approximately equal and
noise floor improves slightly.
Offset from Center of Spectrum, Noise Measured at 5.25 MHz Carrier Offset,
−12.5 dBm/Carrier, V
CDMA2000 Test Model, V
and ±1.98 MHz Carrier Offset, Noise Measured at ±4 MHz Carrier Offset
Input Signal Filtered Using a Cavity-Tuned Filter (Pass Band = 4.6 MHz)
Figure 37. Output Power, Noise, and ACP vs. I and Q Control Voltages,
–10
–20
–30
–40
–50
–60
–70
10
–100
–110
0
–20
–30
–40
–50
–60
–70
–80
–90
Figure 38. Output Spectrum, 3-Carrier CDMA2000 Test Model at
0
REF –15 dBm
CENTER 880MHz
50
OFFSET 0.5dB
NOISE – 4MHz OFFSET, 1MHz RBW
100
ACP – 1.98MHz OFFSET, 30kHz RBW
I
= V
150
Q
*ATT 5dB
I
ACP – 750kHz OFFSET, 30kHz RBW
= V
= 0.353 V, ACP Measured at 2 MHz and 3.23 kHz
P
V
200
OUT
I
= V
Q
, ACP Measured in 30 kHz RBW at ±750 kHz
vs. V
Q
250
=V
1.5MHz/
IN
IN
*RBW 30kHz
*VBW 300kHz
*SWT 5s
(mV)
300
350
CH1
CH2
CH3
TOTAL
ACP LOW
ACP UP
ALT1 LOW
ALT1 UP
MARKER 1 [T1 NOI]
400
885.252403846MHz
–148.83dBm/Hz
SPAN 15MHz
450
–12.65dBm
–12.58dB
–12.87dB
–7.93dB
–61.41dB
–61.87dB
–82.36dB
–81.92dB
1
AD8340
500
–50
–55
–60
–65
–70
–75
–80
–85
–90
SOL
LVL
NOR
A