EVAL-AD5821AEBZ Analog Devices Inc, EVAL-AD5821AEBZ Datasheet - Page 10

• Manufacturer Part Number: EVAL-AD5821AEBZ
• Description: Evaluation Board I.c.
• Manufacturer: Analog Devices Inc

Specifications of EVAL-AD5821AEBZ

• Number Of Dac's: 1
• Number Of Bits: 10
• Outputs And Type: 1, Single Ended
• Sampling Rate (per Second): 400k
• Data Interface: I²C
• Settling Time: 250µs
• Dac Type: Current
• Voltage Supply Source: Single
• Operating Temperature: -30°C ~ 80°C
• Utilized Ic / Part: AD5821A
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD5821A
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL)
is a measurement of the maximum deviation, in LSB, from a
straight line passing through the endpoints of the DAC trans-
fer function. A typical INL vs. code plot is shown in Figure 5.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic by
design. A typical DNL vs. code plot is shown in Figure 6.
Zero-Code Error
Zero-code error is a measurement of the output error when zero
code (0x0000) is loaded to the DAC register. Ideally, the output
is 0 mA. The zero-code error is always positive in the AD5821A
because the output of the DAC cannot go below 0 mA. This is
due to a combination of the offset errors in the DAC and output
amplifier. Zero-code error is expressed in milliamperes (mA).
Gain Error
Gain error is a measurement of the span error of the DAC. It is
the deviation in slope of the DAC transfer characteristic from
the ideal, expressed as a percent of the full-scale range.
Gain Error Drift
Gain error drift is a measurement of the change in gain error
with changes in temperature. It is expressed in LSB/°C.
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Digital-to-Analog Glitch Impulse
This is the impulse injected into the analog output when the
input code in the DAC register changes state. It is normally
specified as the area of the glitch in nanoampere seconds
(nA-sec) and is measured when the digital input code is
changed by 1 LSB at the major carry transition.
Digital Feedthrough
Digital feedthrough is a measurement of the impulse injected
into the analog output of the DAC from the digital inputs of
the DAC, but it is measured when the DAC output is not
updated. It is specified in nanoampere seconds (nA-sec) and
measured with a full-scale code change on the data bus, that is,
from all 0s to all 1s and vice versa.
Offset Error
Offset error is a measurement of the difference between I
(actual) and I
function, expressed in milliamperes (mA). Offset error is
measured on the AD5821A with Code 16 loaded into the DAC
register.
Offset Error Drift
Offset error drift is a measurement of the change in offset error
with a change in temperature. It is expressed in microvolts per
degree Celsius (μV/°C).
OUT
(ideal) in the linear region of the transfer
SINK