AD5612YKSZ-2REEL7 Analog Devices Inc, AD5612YKSZ-2REEL7 Datasheet - Page 6

• Manufacturer Part Number: AD5612YKSZ-2REEL7
• Description: IC,D/A CONVERTER,SINGLE,10-BIT,CMOS,TSSOP,6PIN
• Manufacturer: Analog Devices Inc
• Series: nanoDAC™r

Specifications of AD5612YKSZ-2REEL7

• Settling Time: 6µs
• Number Of Bits: 10
• Data Interface: I²C, Serial
• Number Of Converters: 1
• Voltage Supply Source: Single Supply
• Power Dissipation (max): 500µW
• Operating Temperature: -40°C ~ 125°C
• Mounting Type: Surface Mount
• Package / Case: SC-70-6, SC-88, SOT-363
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD5602/AD5612/AD5622
ABSOLUTE MAXIMUM RATINGS
T
Table 4.
Parameter
V
Digital Input Voltage to GND
V
Operating Temperature Range
Storage Temperature Range
Maximum Junction Temperature
SC70 Package
Lead Temperature, Soldering
ESD
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
DD
OUT
A
Extended Automotive (W, Y Versions)
Extended Industrial (A, B Versions)
θ
θ
Vapor Phase (60 sec)
Infrared (15 sec)
= 25°C, unless otherwise noted.
to GND
JA
JC
to GND
Thermal Impedance
Thermal Impedance
Rating
–0.3 V to + 7.0 V
–0.3 V to V
–0.3 V to V
–40°C to +125°C
−40°C to +85°C
–65°C to +160°C
150°C
332°C/W
120°C/W
215°C
220°C
2.0 kV
DD
DD
+ 0.3 V
+ 0.3 V
Rev. B | Page 6 of 24
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.