MFRC52201HN1 NXP Semiconductors, MFRC52201HN1 Datasheet - Page 79

• Manufacturer Part Number: MFRC52201HN1
• Description: RFID Modules & Development Tools CL READER IC'S
• Manufacturer: NXP Semiconductors

Specifications of MFRC52201HN1

• Data Rate: 3.4 Mbps
• Operating Temperature Range: + 85 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: MFRC52201HN1,157

NXP Semiconductors
16. Test information
MFRC522_33
Product data sheet
PUBLIC
16.1.1 Self test
16.1.2 Test bus
16.1 Test signals
The MFRC522 has the capability to perform a digital self test. The self test is started by
using the following procedure:
FIFO buffer byte values for version 90h:
00h, 87h, 98h, 0fh, 49h, FFh, 07h, 19h
BFh, 22h, 30h, 49h, 59h, 63h, ADh, CAh
7Fh, E3h, 4Eh, 03h, 5Ch, 4Eh, 49h, 50h
47h, 9Ah, 37h, 61h, E7h, E2h, C6h, 2Eh
75h, 5Ah, EDh, 04h, 3Dh, 02h, 4Bh, 78h
32h, FFh, 58h, 3Bh, 7Ch, E9h, 00h, 94h
B4h, 4Ah, 59h, 5Bh, FDh, U9h, 29h, DFh
35h, 96h, 98h, 9Eh, 4Fh, 30h, 32h, 8Dh
FIFO buffer byte values for version 91h:
00h, C6h, 37h, D5h, 32h, B7h, 57h, 5Ch
C2h, D8h, 7Ch, 4Dh, D9h, 70h, C7h, 73h
10h, E6h, D2h, AAh, 5Eh, A1h, 3Eh, 5Ah
14h, AFh, 30h, 61h, C9h, 70h, DBh, 2Eh
64h, 22h, 72h, B5h, BDh, 65h, F4h, ECh
22h, BCh, D3h, 72h, 35h, CDh, AAh, 41h
1Fh, A7h, F3h, 53h, 14h, DEh, 7Eh, 02h
D9h, 0Fh, B5h, 5Eh, 25h, 1Dh, 29h, 79h
The test bus is used for production tests. The following configuration can be used to
improve the design of a system using the MFRC522. The test bus allows internal signals
to be routed to the digital interface. The test bus comprises two sets of test signals which
are selected using their subaddress specified in the TestSel2Reg register’s
TestBusSel[4:0] bits. The test signals and their related digital output pins are described in
Table 156
1. Perform a soft reset.
2. Clear the internal buffer by writing 25 bytes of 00h and implement the Config
3. Enable the self test by writing 09h to the AutoTestReg register.
4. Write 00h to the FIFO buffer.
5. Start the self test with the CalcCRC command.
6. The self test is initiated.
7. When the self test has completed, the FIFO buffer contains the following 64 bytes:
command.
and
Table
157.
Rev. 3 — 26 October 2009
112133
Contactless reader IC
MFRC522
© NXP B.V. 2009. All rights reserved.
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