MFRC52201HN1 NXP Semiconductors, MFRC52201HN1 Datasheet - Page 35

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MFRC52201HN1

Manufacturer Part Number
MFRC52201HN1
Description
RFID Modules & Development Tools CL READER IC'S
Manufacturer
NXP Semiconductors
Datasheets

Specifications of MFRC52201HN1

Data Rate
3.4 Mbps
Operating Temperature Range
+ 85 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
MFRC52201HN1,157

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MFRC52201HN1
Manufacturer:
NXP
Quantity:
500
Part Number:
MFRC52201HN1
Manufacturer:
NXP/恩智浦
Quantity:
20 000
NXP Semiconductors
Table 20.
MFRC522_33
Product data sheet
PUBLIC
Address
(hex)
21h
22h
23h
24h
25h
26h
27h
28h
29h
2Ah
2Bh
2Ch
2Dh
2Eh
2Fh
Page 3: Test register
30h
31h
32h
33h
34h
35h
36h
37h
38h
39h
3Ah
3Bh
3Ch to 3Fh Reserved
MFRC522 register overview
Register name
CRCResultReg
Reserved
ModWidthReg
Reserved
RFCfgReg
GsNReg
CWGsPReg
ModGsPReg
TModeReg
TPrescalerReg
TReloadReg
TCounterValReg
Reserved
TestSel1Reg
TestSel2Reg
TestPinEnReg
TestPinValueReg
TestBusReg
AutoTestReg
VersionReg
AnalogTestReg
TestDAC1Reg
TestDAC2Reg
TestADCReg
Function
shows the MSB and LSB values of the CRC calculation
reserved for future use
controls the ModWidth setting
reserved for future use
configures the receiver gain
selects the conductance of the antenna driver pins TX1 and
TX2 for modulation
defines the conductance of the p-driver output during
periods of no modulation
defines the conductance of the p-driver output during
periods of modulation
defines settings for the internal timer
defines the 16-bit timer reload value
shows the 16-bit timer value
reserved for future use
general test signal configuration
general test signal configuration and PRBS control
enables pin output driver on pins D1 to D7
defines the values for D1 to D7 when it is used as an I/O bus
shows the status of the internal test bus
controls the digital self test
shows the software version
controls the pins AUX1 and AUX2
defines the test value for TestDAC1
defines the test value for TestDAC2
shows the value of ADC I and Q channels
reserved for production tests
…continued
Rev. 3 — 26 October 2009
112133
Refer to
Table 87 on page 54
Table 89 on page 54
Table 91 on page 55
Table 93 on page 55
Table 95 on page 55
Table 97 on page 56
Table 99 on page 56
Table 101 on page 57
Table 103 on page 57
Table 105 on page 57
Table 107 on page 58
Table 109 on page 59
Table 111 on page 59
Table 113 on page 59
Table 115 on page 59
Table 117 on page 60
Table 119 on page 60
Table 121 on page 60
Table 123 on page 61
Table 125 on page 61
Table 127 on page 62
Table 129 on page 62
Table 131 on page 63
Table 133 on page 63
Table 135 on page 65
Table 137 on page 65
Table 139 on page 65
Table 141
on page 66
Contactless reader IC
MFRC522
© NXP B.V. 2009. All rights reserved.
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Table 147
35 of 96

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