CYIS1SM1000-EVAL Cypress Semiconductor Corp, CYIS1SM1000-EVAL Datasheet - Page 8

• Manufacturer Part Number: CYIS1SM1000-EVAL
• Description: MCU, MPU & DSP Development Tools 1M Pixel Radiation Hard CMOS Img Snsr
• Manufacturer: Cypress Semiconductor Corp

Specifications of CYIS1SM1000-EVAL

• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Parameter
Saturation capacity to
meet non-linearity
within + 5%
Output signal swing
Conversion gain
kTC noise
Dynamic Range
Fixed Pattern Noise
Photo Response Non-
uniformity at Qsat/2
(RMS)
Average Dark Current
at 293 K
Dark current signal
DSNU signal
Optical cross-talk
at 600 nm
Anti-blooming capacity
Output amplifier gain
Analogue input
bandwidth
Analogue input signal
range
Analog-Digital
converter
ADC Differential Non-
Linearity (DNL)
ADC Integral Non-
Linearity (INL)
Supply voltage
Power Dissipation
Cypress Semiconductor Corporation 3901 North First Street
Contact:
STAR-1000
Datasheet
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x1, x2.47, x4.59 and x8.64
Global: 1 σ <0.56%
Horizontal: 17.5 %
Local: 1σ < 0.30%
Local: 1σ < 0.67%
Global: σ <3.93%
Document #:38-05714 Rev.**(Revision 6.5)
1.055 % of Vsat
Vertical: 16 %
Typical value
of full well
of full well
0.1 to 4.9
<= ±3.5
<= ±5.8
99.000
x 1000
< 350
< 100
3135
11.4
223
1.1
9.5
35
72
10
5
Value
pA/cm
µV/e-
MHz
Unit
e- / s
LSB
LSB
mW
dB
Bit
e-
e-
V
V
V
San Jose, CA 95134 408-943-2600
2
Comment
Controlled by 2 bits
Radiation-tolerant version of the
ADC on Ibis4 and other image
sensors.
Integral non-linearity of ADC is
better than linearity of image sensor.
Digital input signals are 3.3 V
compatible
With internal ADC powered.
Without internal ADC powered.
Both values measured at nominal
speed (12 MHz).
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