ACPL-W70L-560E Avago Technologies US Inc., ACPL-W70L-560E Datasheet - Page 7

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ACPL-W70L-560E

Manufacturer Part Number
ACPL-W70L-560E
Description
Stretch Singles Pb-free TR VDE
Manufacturer
Avago Technologies US Inc.
Datasheet

Specifications of ACPL-W70L-560E

Voltage - Isolation
5000Vrms
Number Of Channels
1, Unidirectional
Current - Output / Channel
10mA
Data Rate
15MBd
Propagation Delay High - Low @ If
23ns @ 6mA
Current - Dc Forward (if)
10mA
Input Type
DC
Output Type
Push-Pull, Totem-Pole
Mounting Type
Surface Mount
Package / Case
6-SSOP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ACPL-W70L-560E
Manufacturer:
AVAGO/安华高
Quantity:
20 000
Switching Specifications
Over recommended temperature (T
All typical specifications are at T
Package Characteristics
All Typical at T
Notes:
1. Slew rate of supply voltage ramping is recommended to ensure no glitch more than 1V to appear at the output pin.
2. t
3. PWD is defined as |t
4. t
5. CM
6. CM
7
Parameter
Propagation Delay Time
to Logic Low Output
Propagation Delay Time
to Logic High Output
Pulse Width
Pulse Width Distortion
Propagation Delay Skew
Output Rise Time
(10% – 90%)
Output Fall Time
(90% - 10%)
Common Mode Transient Immunity
at Logic High Output
Common Mode Transient Immunity
at Logic Low Output
Parameter
Input-Output Insulation
Input-Output Momentary
Withstand Voltage
Input-Output Resistance
Input-Output Capacitance
t
recommended operating conditions.
PHL
PLH
PSK
H
L
is equal to the magnitude of the worst case difference in t
propagation delay is measured from the 50% level on the rising edge of the input pulse to the 50% level on the falling edge of the V
propagation delay is measured from the 50% level on the falling edge of the input pulse to the 50% level on the rising edge of the V
is the maximum tolerable rate of fall of the common mode voltage to assure that the output will remain in a low logic state.
is the maximum tolerable rate of rise of the common mode voltage to assure that the output will remain in a high logic state.
A
= 25°C.
PHL
[6]
[2]
[5]
[2]
[3]
- t
[4]
PLH
|.
A
=+25°C, V
A
Symbol
t
t
t
|PWD|
t
t
t
| CM
| CM
Symbol
I
V
R
C
= –40°C to +105°C), 3.0V≤V
I-O
PHL
PLH
PW
PSK
R
F
ISO
I-O
I-O
H
L
|
DD
|
= +3.3V.
Min.
66.7
0
10
10
Min.
5000
PHL
and/or t
Typ.
23
27
4
3.5
3.5
15
15
Typ.
10
0.6
PLH
12
DD
that will be seen between units at any given temperature within the
≤ 3.6V and 4.5 V ≤V
Max.
55
55
25
40
Max.
1.0
Units
ns
ns
ns
ns
ns
ns
ns
kV/μs
kV/μs
Units
μA
V
:
pF
rms
Test Conditions
I
CMOS Signal Levels
I
CMOS Signal Levels
I
CMOS Signal Levels
I
CMOS Signal Levels
I
CMOS Signal Levels
I
CMOS Signal Levels
V
V
Test Conditions
45% RH, t = 5 s
V
T
RH ≤ 50%, t = 1 min.,
T
V
f = 1 MHz, T
DD
F
F
F
F
F
F
A
A
CM
CM
I-O
I-O
= 6 mA, C
= 6 mA, C
= 6 mA, C
= 6 mA, C
= 6 mA, C
= 0 mA, C
= 25°C
= 25°C
≤ 5.5 V.
= 3 kV DC,
= 1000 V, T
= 1000 V, T
= 500 V dc
A
L
L
L
L
L
L
= 15pF
= 15pF
= 15pF
= 15pF
= 15pF
= 15pF
= 25°C
A
A
= 25°C, I
= 25°C, I
F
F
= 6 mA
= 0 mA
O
O
signal.
signal.

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