STM32F103ZGH6 STMicroelectronics, STM32F103ZGH6 Datasheet - Page 108

MCU 32BIT 1MB FLASH 144LQFP

STM32F103ZGH6

Manufacturer Part Number
STM32F103ZGH6
Description
MCU 32BIT 1MB FLASH 144LQFP
Manufacturer
STMicroelectronics
Series
STM32r
Datasheet

Specifications of STM32F103ZGH6

Core Processor
ARM® Cortex-M3™
Core Size
32-Bit
Speed
72MHz
Connectivity
CAN, I²C, IrDA, LIN, MMC, SPI, UART/USART, USB
Peripherals
DMA, I²S, LCD, POR, PWM, WDT
Number Of I /o
112
Program Memory Size
1MB (1M x 8)
Program Memory Type
FLASH
Ram Size
96K x 8
Voltage - Supply (vcc/vdd)
2 V ~ 3.6 V
Data Converters
A/D 21x12b; D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Processor Series
STM32F101xG
Core
ARM Cortex M3
Data Bus Width
32 bit
Data Ram Size
80 KB
Interface Type
I2C, SPI, UART
Maximum Clock Frequency
36 MHz
Number Of Programmable I/os
112
Number Of Timers
15
Operating Supply Voltage
2 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Operating Temperature Range
- 40 C to + 105 C
Processor To Be Evaluated
STM32F103ZG
Supply Current (max)
28 mA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details
Other names
497-11115

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0
Electrical characteristics
Table 63.
1. Guaranteed by design, not tested in production.
2. Preliminary values.
Figure 59. 12-bit buffered /non-buffered DAC
1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external loads directly
108/120
INL
Offset
Gain
error
t
Update
rate
t
PSRR+
SETTLING
WAKEUP
Symbol
without the use of an external operational amplifier. The buffer can be bypassed by configuring the BOFFx bit in the
DAC_CR register.
(2)
(2)
(2)
(2)
(1)
(2)
(2)
Integral non linearity
(difference between
measured value at Code i
and the value at Code i on a
line drawn between Code 0
and last Code 1023)
Offset error
(difference between
measured value at Code
(0x800) and the ideal value =
V
Gain error
Settling time (full scale: for a
10-bit input code transition
between the lowest and the
highest input codes when
DAC_OUT reaches final
value ±1LSB
Max frequency for a correct
DAC_OUT change when
small variation in the input
code (from code i to i+1LSB)
Wakeup time from off state
(Setting the ENx bit in the
DAC Control register)
Power supply rejection ratio
(to V
measurement
DAC characteristics (continued)
REF+
DDA
/2)
) (static DC
Parameter
Buffered/Non-buffered DAC
12-bit
digital to
analog
converter
Min
Doc ID 16554 Rev 2
3
6.5
–67
Buffer(1)
Typ
±1
±4
±10
±3
±12
±0.5
4
1
10
–40
Max
DACx_OUT
LSB
LSB
mV
LSB
LSB
%
µs
MS/s C
µs
dB
Unit
C
R
Given for the DAC in 10-bit
configuration
Given for the DAC in 12-bit
configuration
Given for the DAC in 12-bit
configuration
Given for the DAC in 10-bit at V
= 3.6 V
Given for the DAC in 12-bit at V
= 3.6 V
Given for the DAC in 12bit
configuration
C
C
input code between lowest and
highest possible ones.
No R
LOAD
LOAD
LOAD
LOAD
LOAD
STM32F103xF, STM32F103xG
LOAD
 50 pF, R
 50 pF, R
 50 pF, R
, C
LOAD
Comments
ai17157
LOAD
LOAD
LOAD
= 50 pF
 5 k
 5 k
 5 k
REF+
REF+

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