IDTTSE2002B3CNCG8 IDT, Integrated Device Technology Inc, IDTTSE2002B3CNCG8 Datasheet - Page 10

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IDTTSE2002B3CNCG8

Manufacturer Part Number
IDTTSE2002B3CNCG8
Description
IC TEMP SENS EEPROM TDFN-8
Manufacturer
IDT, Integrated Device Technology Inc
Datasheet

Specifications of IDTTSE2002B3CNCG8

Function
Temp Monitoring System (Sensor)
Topology
ADC (Sigma Delta), Control Logic, Register Bank
Sensor Type
Internal
Sensing Temperature
-20°C ~ 125°C
Output Type
2-Wire Serial, I²C™/SMBUS™
Output Alarm
No
Output Fan
No
Voltage - Supply
3 V ~ 3.6 V
Operating Temperature
-20°C ~ 125°C
Mounting Type
Surface Mount
Package / Case
8-WFDFN Exposed Pad
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
800-2034-2
EVENT Pin Mode Functionality
Serial Communications
in the lower sector (from location 0x00 to 0x7F), designed specifically for use in DRAM DIMMs (Dual Inline Memory Modules) with Serial Presence
Detect. All the information concerning the DRAM module configuration (such as its access speed, its size, its organization) can be kept write protected
in the first half of the memory.
specific I2C sequence, the first 128 bytes of the memory become write protected, either permanently or resetable.
per second. Temperature data is latched internally by the device and may be read by software from the bus host at any time.
high, low, and critical temperature limits. Finally, the device EVENT pin can be configured as active high or active low and can be configured to operate
as an interrupt or as a comparator output.
The SPD section of the TSE2002B3C is a 2 Kbit serial EEPROM organized as a 256 byte memory. The device is able to lock permanently the data
Locking the lower sector of the SPD may be accomplished using one of two software write protection mechanisms. By sending the device a
The TSE2002B3C temperature sensor circuitry continuously monitors the temperature and updates the temperature data minimum of eight times
Internal registers are used to configure both the TS performance and response to over-temperature conditions. The device contains programmable
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May 12, 2010

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