ATMEGA64A-MN Atmel, ATMEGA64A-MN Datasheet - Page 262
ATMEGA64A-MN
Manufacturer Part Number
ATMEGA64A-MN
Description
IC MCU AVR 64K FLASH 8QFN
Manufacturer
Atmel
Series
AVR® ATmegar
Datasheet
1.ATMEGA64A-AU.pdf
(392 pages)
Specifications of ATMEGA64A-MN
Core Processor
AVR
Core Size
8-Bit
Speed
16MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
53
Program Memory Size
64KB (32K x 16)
Program Memory Type
FLASH
Eeprom Size
2K x 8
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
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25.4.2
25.4.3
25.4.4
25.4.5
25.5
25.5.1
8160C–AVR–07/09
Boundary-scan Chain
IDCODE; 0x1
SAMPLE_PRELOAD; 0x2
AVR_RESET; 0xC
BYPASS; 0xF
Scanning the Digital Port Pins
Optional JTAG instruction selecting the 32-bit ID-Register as data register. The ID-Register con-
sists of a version number, a device number and the manufacturer code chosen by JEDEC. This
is the default instruction after Power-up.
The active states are:
Mandatory JTAG instruction for taking a snap-shot of the input/output pins without affecting the
system operation, and pre-loading the output latches. However, the output latches are not con-
nected to the pins. The Boundary-scan Chain is selected as data register.
The active states are:
The AVR specific public JTAG instruction for forcing the AVR device into the Reset mode or
releasing the JTAG Reset source. The TAP controller is not reset by this instruction. The one bit
Reset Register is selected as data register. Note that the reset will be active as long as there is
a logic “one” in the Reset Chain. The output from this chain is not latched.
The active states are:
Mandatory JTAG instruction selecting the Bypass Register for Data Register.
The active states are:
The Boundary-scan Chain has the capability of driving and observing the logic levels on the dig-
ital I/O pins, as well as the boundary between digital and analog logic for analog circuitry having
Off-chip connection.
Figure 25-3
cell consists of a standard Boundary-scan cell for the Pull-up Enable – PUExn – function, and a
bi-directional pin cell that combines the three signals, Output Control – OCxn, Output Data –
ODxn, and Input Data – IDxn, into only a two-stage Shift Register. The port and pin indexes are
not used in the following description.
• Capture-DR: Data in the IDCODE Register is sampled into the Boundary-scan Chain.
• Shift-DR: The IDCODE scan chain is shifted by the TCK input.
• Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.
• Shift-DR: The Boundary-scan Chain is shifted by the TCK input.
• Update-DR: Data from the Boundary-scan Chain is applied to the output latches. However,
• Shift-DR: The Reset Register is shifted by the TCK input.
• Capture-DR: Loads a logic “0” into the Bypass Register.
• Shift-DR: The Bypass Register cell between TDI and TDO is shifted.
the output latches are not connected to the pins.
shows the Boundary-scan Cell for a bi-directional port pin with pull-up function. The
ATmega64A
262
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