ATMEGA165PV-8ANR Atmel, ATMEGA165PV-8ANR Datasheet - Page 241
![IC MCU AVR 16K 8MHZ 64TQFP](/photos/12/13/121332/313-64-tqfp_sml.jpg)
ATMEGA165PV-8ANR
Manufacturer Part Number
ATMEGA165PV-8ANR
Description
IC MCU AVR 16K 8MHZ 64TQFP
Manufacturer
Atmel
Series
AVR® ATmegar
Specifications of ATMEGA165PV-8ANR
Core Processor
AVR
Core Size
8-Bit
Speed
8MHz
Connectivity
SPI, UART/USART, USI
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
54
Program Memory Size
16KB (8K x 16)
Program Memory Type
FLASH
Eeprom Size
512 x 8
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-TQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
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8019K–AVR–11/10
Note:
If the ADC is not to be used during scan, the recommended input values from
page 239
scan. Switch-Cap based differential amplifier requires fast operation and accurate timing which
is difficult to obtain when used in a scan chain. Details concerning operations of the differential
amplifier is therefore not provided.
The AVR ADC is based on the analog circuitry shown in
sive approximation algorithm implemented in the digital logic. When used in Boundary-scan, the
problem is usually to ensure that an applied analog voltage is measured within some limits. This
can easily be done without running a successive approximation algorithm: apply the lower limit
on the digital DAC[9:0] lines, make sure the output from the comparator is low, then apply the
upper limit on the digital DAC[9:0] lines, and verify the output from the comparator to be high.
The ADC need not be used for pure connectivity testing, since all analog inputs are shared with
a digital port pin as well.
When using the ADC, remember the following:
• The port pin for the ADC channel in use must be configured to be an input with pull-up disabled
• In Normal mode, a dummy conversion (consisting of 10 comparisons) is performed when
• The DAC values must be stable at the midpoint value 0x200 when having the HOLD signal low
As an example, consider the task of verifying a 1.5V ±5% input signal at ADC channel 3 when
the power supply is 5.0V and AREF is externally connected to V
The recommended values from
in the algorithm in
are shown. The column “Actions” describes what JTAG instruction to be used before filling the
Boundary-scan Register with the succeeding columns. The verification should be done on the
data scanned out when scanning in the data on the same row in the table.
to avoid signal contention.
enabling the ADC. The user is advised to wait at least 200 ns after enabling the ADC before
controlling/observing any ADC signal, or perform a dummy conversion before using the first
result.
(Sample mode).
1. Incorrect setting of the switches in
should be used. The user is recommended not to use the Differential Amplifier during
may damage the part. There are several input choices to the S&H circuitry on the negative
input of the output comparator in
selected from either one ADC pin, Bandgap reference source, or Ground.
The lower limit is:
The upper limit is:
Table 23-4 on page
Table 23-3 on page 239
1024 1.5V 0,95 5V
1024 1.5V 1.05 5V
242. Only the DAC and port pin values of the Scan Chain
Figure 23-9 on page
Figure 23-9 on page 238
⋅
⋅
⋅
⋅
⁄
⁄
Figure 23-9 on page 238
are used unless other values are given
=
=
238. Make sure only one path is
291
323
CC
=
=
will make signal contention and
.
0x123
0x143
ATmega165P
Table 23-3 on
with a succes-
241
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