SAK-TC1796-256F150E BE Infineon Technologies, SAK-TC1796-256F150E BE Datasheet - Page 133

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SAK-TC1796-256F150E BE

Manufacturer Part Number
SAK-TC1796-256F150E BE
Description
IC MCU 32BIT FLASH 416-BGA
Manufacturer
Infineon Technologies
Series
TC17xxr
Datasheet

Specifications of SAK-TC1796-256F150E BE

Core Processor
TriCore
Core Size
32-Bit
Speed
150MHz
Connectivity
ASC, CAN, EBI/EMI, MLI, MSC, SSC
Peripherals
DMA, POR, WDT
Number Of I /o
123
Program Memory Size
2MB (2M x 8)
Program Memory Type
FLASH
Ram Size
256K x 8
Voltage - Supply (vcc/vdd)
1.42 V ~ 1.58 V
Data Converters
A/D 44x12b
Oscillator Type
External
Operating Temperature
-40°C ~ 125°C
Package / Case
416-BGA
Data Bus Width
32 bit
Data Ram Size
256 KB
Interface Type
ASC, JTAG, MLI, MSC, SSC
Maximum Clock Frequency
150 MHz
Number Of Programmable I/os
119
Number Of Timers
260
Maximum Operating Temperature
+ 125 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Adc
2 (12 bit, 16 Channel) / 10 bit, 4 Channel
Packages
P-BGA-416
Max Clock Frequency
150.0 MHz
Sram (incl. Cache)
256.0 KByte
Can Nodes
4
A / D Input Lines (incl. Fadc)
44
Program Memory
2.0 MB
For Use With
B158-H8537-G2-X-7600IN - KIT STARTER TC179X FAMILY
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details
Other names
SP000438972
5.4
Table 37
Parameter
Operation
Lifetime
ESD susceptibility
according to
Human Body
Model (HBM)
ESD susceptibility
of the LVDS pins
ESD susceptibility
according to
Charged Device
Model (CDM)
Moisture
Sensitivity Level
1) This lifetime refers only to the time when the device is powered on.
2) One example of a detailed temperature profile is:
Data Sheet
2000 hours at
16000 hours at
6000 hours at
This example is equivalent to the operation lifetime and average temperatures given in the table.
1)2)
Quality Declarations
T
T
Quality Parameters
T
j
j
= 150
= 110
j
= 125
Symbol
t
V
V
V
MSL
o
o
OP
C
C
o
HBM
HBM1
CDM
C
Min. Typ. Max.
Values
133
24000 hours at average weighted junction
66000 hours at average weighted junction
20
2000
500
500
3
Unit
years at average weighted junction
V
V
V
Note / Test Condition
temperature
temperature
temperature
Conforming to
EIA/JESD22-A114-B
Conforming to
JESD22-C101-C
Conforming to Jedec
J-STD-020C for 240°C
Package and Reliability
T
T
T
j
j
j
= 127
= 100
= 85
V1.0, 2008-04
o
TC1796
C
o
o
C
C

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