SAK-XC2365B-40F80L AA Infineon Technologies, SAK-XC2365B-40F80L AA Datasheet - Page 72

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SAK-XC2365B-40F80L AA

Manufacturer Part Number
SAK-XC2365B-40F80L AA
Description
IC MCU 16BIT 320KB FLASH 100LQFP
Manufacturer
Infineon Technologies
Series
XC23xxBr
Datasheet

Specifications of SAK-XC2365B-40F80L AA

Core Processor
C166SV2
Core Size
16/32-Bit
Speed
80MHz
Connectivity
CAN, EBI/EMI, I²C, LIN, SPI, SSC, UART/USART, USI
Peripherals
I²S, POR, PWM, WDT
Number Of I /o
76
Program Memory Size
320KB (320K x 8)
Program Memory Type
FLASH
Ram Size
34K x 8
Voltage - Supply (vcc/vdd)
3 V ~ 5.5 V
Data Converters
A/D 16x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Package / Case
100-LSQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details
4.1.1
The following operating conditions must not be exceeded to ensure correct operation of
the XC236xB. All parameters specified in the following sections refer to these operating
conditions, unless otherwise noticed.
Note: Typical parameter values refer to room temperature and nominal supply voltage,
Table 13
Parameter
Voltage Regulator Buffer
Capacitance for DMP_M
Voltage Regulator Buffer
Capacitance for DMP_1
External Load
Capacitance
System frequency
Overload current for
analog inputs
Overload current for digital
inputs
Overload current coupling
factor for analog inputs
Data Sheet
6)
minimum/maximum
minimum/maximum temperature and minimum/maximum supply voltage.
Additional details are described where applicable.
Operating Conditions
6)
Operating Conditions
7)
Symbol
C
SR
C
SR
C
f
I
I
K
CC
SYS
OVA
OVD
parameter
EVRM
EVR1
L
OVA
SR
SR
SR -2
SR -5
Min.
1.0
0.47
XC2361B, XC2363B, XC2364B, XC2365B
72
values
Values
Typ.
20
2.5 x
10
1.0 x
10
3)
-4
-6
also
XC2000 Family / Value Line
Max.
4.7
2.2
80
5
5
1.5 x
10
1.0 x
10
-3
-4
include
Unit Note /
μF
μF
pF
MHz
mA
mA
-
-
Electrical Parameters
Test Condition
pin out
driver= default
4)
not subject to
production test
not subject to
production test
I
subject to
production test
I
subject to
production test
OV
OV
conditions
1)
2)1)
5)
< 0 mA; not
> 0 mA; not
V1.2, 2010-04
of

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