HD64F2166VTE33 Renesas Electronics America, HD64F2166VTE33 Datasheet - Page 739

• Manufacturer Part Number: HD64F2166VTE33
• Description: IC H8S MCU FLASH 512K 144-TQFP
• Manufacturer: Renesas Electronics America
• Series: H8® H8S/2100r

Specifications of HD64F2166VTE33

• Core Processor: H8S/2000
• Core Size: 16-Bit
• Speed: 33MHz
• Connectivity: I²C, IrDA, LPC, SCI, SmartCard
• Peripherals: POR, PWM, WDT
• Number Of I /o: 106
• Program Memory Size: 512KB (512K x 8)
• Program Memory Type: FLASH
• Ram Size: 40K x 8
• Voltage - Supply (vcc/vdd): 3 V ~ 3.6 V
• Data Converters: A/D 8x10b; D/A 2x8b
• Oscillator Type: Internal
• Operating Temperature: -20°C ~ 75°C
• Package / Case: 144-TQFP, 144-VQFP
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Eeprom Size: -

The JTAG (Joint Test Action Group) is standardized as an international standard, IEEE Standard
1149.1, and is open to the public as IEEE Standard Test Access Port and Boundary-Scan
Architecture. Although the name of the function is boundary scan and the name of the group who
worked on standardization is the JTAG, the JTAG is commonly used as the name of a boundary
scan architecture and a serial interface to access the devices having the architecture.
This LSI has a boundary scan function (JTAG). Using this function along with other LSIs
facilitates testing a printed-circuit board.
21.1
• Five test pins (ETCK, ETDI, ETDO, ETMS, and ETRST)
• TAP controller
• Six instructions
HUDS000A_000120020900
BYPASS mode
EXTEST mode
SAMPLE/PRELOAD mode
CLAMP mode
HIGHZ mode
IDCODE mode
(These instructions are test modes corresponding to IEEE 1149.1.)
Features
Section 21 Boundary Scan (JTAG)
Rev. 3.00, 03/04, page 697 of 830