STM32F102C8T6TR STMicroelectronics, STM32F102C8T6TR Datasheet - Page 46

• Manufacturer Part Number: STM32F102C8T6TR
• Description: MCU 32BIT ARM 64K FLASH 48-LQFP
• Manufacturer: STMicroelectronics
• Series: STM32r

Specifications of STM32F102C8T6TR

• Core Processor: ARM® Cortex-M3™
• Core Size: 32-Bit
• Speed: 48MHz
• Connectivity: I²C, IrDA, LIN, SPI, UART/USART, USB
• Peripherals: DMA, PDR, POR, PVD, PWM, Temp Sensor, WDT
• Number Of I /o: 37
• Program Memory Size: 64KB (64K x 8)
• Program Memory Type: FLASH
• Ram Size: 10K x 8
• Voltage - Supply (vcc/vdd): 2 V ~ 3.6 V
• Data Converters: A/D 10x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 48-LQFP
• Processor Series: STM32F102x
• Core: ARM Cortex M3
• Data Bus Width: 32 bit
• Data Ram Size: 10 KB
• Interface Type: I2C, SPI, USART
• Maximum Clock Frequency: 48 MHz
• Number Of Programmable I/os: 37
• Number Of Timers: 6
• Operating Supply Voltage: 2 V to 3.6 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWARM, EWARM-BL, MDK-ARM, RL-ARM, ULINK2
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 12 bit, 10 Channel
• For Use With: 497-10030 - STARTER KIT FOR STM32497-6438 - BOARD EVALUTION FOR STM32 512K
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Details

Electrical characteristics
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Table 30.
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
Table 31.
1. Based on characterization results, not tested in production.
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
●
●
These tests are compliant with EIA/JESD 78 IC latch-up standard.
Table 32.
Symbol Parameter
V
V
Symbol
S
Symbol
ESD(HBM)
ESD(CDM)
EMI
LU
A supply overvoltage is applied to each power supply pin
A current injection is applied to each input, output and configurable I/O pin
Peak level
Static latch-up class
EMI characteristics
ESD absolute maximum ratings
Electrostatic discharge voltage
(human body model)
Electrostatic discharge voltage
(charge device model)
Electrical sensitivities
Parameter
V
DD
Ratings
3.3 V, T
Conditions
Doc ID 15056 Rev 3
A
T
A
25 °C,
+105 °C conforming to JESD78A
T
to JESD22-A114
T
to JESD22-C101
A
A
0.1 MHz to 30 MHz
30 MHz to 130 MHz
130 MHz to 1GHz
SAE EMI Level
+25 °C, conforming
+25 °C, conforming
frequency band
Conditions
Monitored
Conditions
STM32F102x8, STM32F102xB
Max vs. [f
2
II
Class
8/48 MHz
3.5
13
7
8
HSE
Maximum
value
2000
/f
500
HCLK
II level A
(1)
Class
]
dBµV
Unit
Unit
V
-