MC9S08DV60ACLC Freescale Semiconductor, MC9S08DV60ACLC Datasheet - Page 367
![IC MCU 60K FLASH 3K RAM 32-LQFP](/photos/12/17/121791/mc9s08dv60aclc_sml.jpg)
MC9S08DV60ACLC
Manufacturer Part Number
MC9S08DV60ACLC
Description
IC MCU 60K FLASH 3K RAM 32-LQFP
Manufacturer
Freescale Semiconductor
Series
HCS08r
Specifications of MC9S08DV60ACLC
Core Processor
HCS08
Core Size
8-Bit
Speed
40MHz
Connectivity
CAN, I²C, LIN, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
25
Program Memory Size
60KB (60K x 8)
Program Memory Type
FLASH
Ram Size
3K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 10x12b
Oscillator Type
External
Operating Temperature
-40°C ~ 85°C
Package / Case
32-LQFP
Processor Series
S08DV
Core
HCS08
Data Bus Width
8 bit
Data Ram Size
3 KB
Interface Type
CAN, I2C, SCI, SPI
Number Of Programmable I/os
26
Operating Supply Voltage
5.5 V
Mounting Style
SMD/SMT
3rd Party Development Tools
EWS08
Development Tools By Supplier
DEMO9S08DZ60
On-chip Adc
12 bit, 10 channel
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Details
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
MC9S08DV60ACLC
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
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Appendix A
Electrical Characteristics
A.1
This section contains the most accurate electrical and timing information for the MC9S08DV60 Series of
microcontrollers available at the time of publication.
A.2
The electrical parameters shown in this supplement are guaranteed by various methods. To give the
customer a better understanding the following classification is used and the parameters are tagged
accordingly in the tables where appropriate:
A.3
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not
guaranteed. Stress beyond the limits specified in
permanent damage to the device. For functional operating conditions, refer to the remaining tables in this
section.
Freescale Semiconductor
C
D
P
T
Introduction
Parameter Classification
Absolute Maximum Ratings
Those parameters are guaranteed during production testing on each individual device.
Those parameters are achieved by the design characterization by measuring a
statistically relevant sample size across process variations.
Those parameters are achieved by design characterization on a small sample size from
typical devices under typical conditions unless otherwise noted. All values shown in
the typical column are within this category.
Those parameters are derived mainly from simulations.
The classification is shown in the column labeled “C” in the parameter
tables where appropriate.
Table A-1. Parameter Classifications
MC9S08DV60 Series Data Sheet, Rev 3
Table A-2
NOTE
may affect device reliability or cause
367
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