MCF51QE128CLH Freescale Semiconductor, MCF51QE128CLH Datasheet - Page 9
![IC MCU 32BIT 128K FLASH 64-LQFP](/photos/12/17/121777/mcf51qe128clh_sml.jpg)
MCF51QE128CLH
Manufacturer Part Number
MCF51QE128CLH
Description
IC MCU 32BIT 128K FLASH 64-LQFP
Manufacturer
Freescale Semiconductor
Series
MCF51QEr
Specifications of MCF51QE128CLH
Core Processor
Coldfire V1
Core Size
32-Bit
Speed
50MHz
Connectivity
I²C, SCI, SPI
Peripherals
LVD, PWM, WDT
Number Of I /o
54
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Ram Size
8K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 20x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-LQFP
Processor Series
MCF51QE
Core
ColdFire V1
Data Bus Width
32 bit
Data Ram Size
8 KB
Interface Type
SCI/SPI
Maximum Clock Frequency
50.33 MHz
Number Of Programmable I/os
54
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
JLINK-CF-BDM26, EWCF
Development Tools By Supplier
EVBQE128, DEMOQE128
Minimum Operating Temperature
- 40 C
On-chip Adc
20-ch x 12-bit
For Use With
EVBQE128 - BOARD EVAL FLEXIS QE128 FAMILYDEMOQE128 - DEMO BOARD FOR QE128 FLEXIS
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
MCF51QE128CLH
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
3
3.1
This section contains electrical and timing specifications for the MCF51QE128 series of microcontrollers available at the time
of publication.
3.2
The electrical parameters shown in this supplement are guaranteed by various methods. To give the customer a better
understanding the following classification is used and the parameters are tagged accordingly in the tables where appropriate:
3.3
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Stress beyond the
limits specified in
conditions, refer to the remaining tables in this section.
This device contains circuitry protecting against damage due to high static voltage or electrical fields; however, it is advised
that normal precautions be taken to avoid application of any voltages higher than maximum-rated voltages to this
high-impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate logic voltage level (for
instance, either V
Freescale Semiconductor
C
D
P
T
Electrical Characteristics
Introduction
Parameter Classification
Absolute Maximum Ratings
Those parameters are guaranteed during production testing on each individual device.
Those parameters are achieved by the design characterization by measuring a statistically relevant sample
size across process variations.
Those parameters are achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted. All values shown in the typical column are within this
category.
Those parameters are derived mainly from simulations.
SS
The classification is shown in the column labeled “C” in the parameter tables where
appropriate.
Table 4
or V
1
2
3
SPI1 pins (SS1, MISO1, MOSI1, and SPSCK2) can be repositioned using SPI1PS
in SOPT2. Default locations are PTB5, PTB4, PTB3, and PTB2.
IIC1 pins (SCL1 and SDA1) can be repositioned using IIC1PS in SOPT2. Default
locations are PTA3 and PTA2, respectively.
The PTA4/ACMP1O/BKGD/MS is limited to output only for the port I/O function.
DD
may affect device reliability or cause permanent damage to the device. For functional operating
) or the programmable pull-up resistor associated with the pin is enabled.
MCF51QE128 Series Data Sheet, Rev. 7
Table 3. Parameter Classifications
NOTE
Electrical Characteristics
9