LUCL8567AAU-D AGERE [Agere Systems], LUCL8567AAU-D Datasheet - Page 19

• Manufacturer Part Number: LUCL8567AAU-D
• Description: SLIC for Peoples Republic of China Applications
• Manufacturer: AGERE [Agere Systems]

Data Sheet
August 1999
Lucent Technologies Inc.
Test Configurations
RFI Rejection
Figures 12—14 show the typical RFI rejection performance of the L8567 under the various conditions listed within
each figure title. The test circuit is shown below. The input signal is 100 kHz to 100 MHz, 1 Vrms and 2 Vrms, 80%
AM, with 1 kHz side tone applied using an R&S T network (CDN). This test is performed to the IEC 801-6 (1994)
specification. Note that all power supplies (V
with 1 nF capacitors, and all grounds are shorted on the bottom of the board as close as possible to the IC. Note
that no RFI LP filter is used at tip and ring.
* HP is a registered trademark of Hewlett-Packard Company.
HP * TIMS
4935A
(continued)
600
Figure 12. RFI Rejection Test Circuit
NETWORK
R&ST
CC
, V
DD
, V
RING
TIP
BAT
) are bypassed to ground, as close as possible to the IC,
HP 8648C
SIGNAL
GENERATOR
People’s Republic of China Applications
L8567
VTX
1 k
SPECTRUM
ANALYZER
HP 3580A
L8567 SLIC for
12-3456 (F)
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