LUCL8567AAU-D AGERE [Agere Systems], LUCL8567AAU-D Datasheet - Page 17

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LUCL8567AAU-D

Manufacturer Part Number
LUCL8567AAU-D
Description
SLIC for Peoples Republic of China Applications
Manufacturer
AGERE [Agere Systems]
Datasheet
Data Sheet
August 1999
Lucent Technologies Inc.
Test Configurations
V
BAT2
0.1 F
RING
R
TIP
LOOP
63.4 k
7.87 k
68
68
PWR
V
RTSN
TG
VTX
Figure 6. Basic Test Circuit
PT
PR
DC
I
RTSP
PROG
BAT2
V
OUT
V
BAT1
BAT1
0.1 F
BGND V
L8567
SLIC
V
CC
CC
0.1 F
NSTAT
RCVN
RD1O
RD2O
RD3O
RCVP
NTSD
AGND
People’s Republic of China Applications
RD1I
RD2I
RD3I
CF1
CF2
VTX
EN
B1
B0
0.1 F
0.1 F
51.1 k
11 k
27.4 k
XMT
RCV
L8567 SLIC for
12-2578.e (F)
17

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