K20P104M100SF2 Freescale Semiconductor, K20P104M100SF2 Datasheet - Page 17

• Manufacturer Part Number: K20P104M100SF2
• Description: K20 Sub-Family
• Manufacturer: Freescale Semiconductor

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5.1.6 EMC radiated emissions operating behaviors
1. Determined according to IEC Standard 61967-1, Integrated Circuits - Measurement of Electromagnetic Emissions, 150
2. V
3. Specified according to Annex D of IEC Standard 61967-2, Measurement of Radiated Emissions—TEM Cell and Wideband
Freescale Semiconductor, Inc.
V
Figure 2. Run mode supply current vs. core frequency — all peripheral clocks enabled
RE_IEC_SAE
Symbol
kHz to 1 GHz Part 1: General Conditions and Definitions, IEC Standard 61967-2, Integrated Circuits - Measurement of
Electromagnetic Emissions, 150 kHz to 1 GHz Part 2: Measurement of Radiated Emissions—TEM Cell and Wideband
TEM Cell Method, and SAE Standard J1752-3, Measurement of Radiated Emissions from Integrated Circuits—TEM/
Wideband TEM (GTEM) Cell Method.
TEM Cell Method, and Appendix D of SAE Standard J1752-3, Measurement of Radiated Emissions from Integrated
Circuits—TEM/Wideband TEM (GTEM) Cell Method.
V
V
V
V
DD
RE1
RE2
RE3
RE4
= 3 V, T
Radiated emissions voltage, band 1
Radiated emissions voltage, band 2
Radiated emissions voltage, band 3
Radiated emissions voltage, band 4
IEC and SAE level
Description
A
= 25 °C, f
Table 6. EMC radiated emissions operating behaviors
OSC
K20 Sub-Family Data Sheet Data Sheet, Rev. 1, 11/2010.
= 16 MHz (crystal), f
BUS
= 20 MHz
Preliminary
band (MHz)
Frequency
0.15–1000
500–1000
150–500
0.15–50
50–150
TBD
TBD
TBD
TBD
TBD
Typ.
dBμV
Unit
—
Notes
1,
2,
General
2
3
17
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