LH28F016SUT-10 Sharp Electronics, LH28F016SUT-10 Datasheet - Page 17

• Manufacturer Part Number: LH28F016SUT-10
• Manufacturer: Sharp Electronics

Specifications of LH28F016SUT-10

• Cell Type: NOR
• Density: 16Mb
• Access Time (max): 100ns
• Interface Type: Parallel
• Boot Type: Not Required
• Address Bus: 21/20Bit
• Operating Supply Voltage (typ): 3.3/5V
• Operating Temp Range: 0C to 70C
• Package Type: TSOP-I
• Program/erase Volt (typ): 4.5 to 5.5V
• Sync/async: Asynchronous
• Operating Temperature Classification: Commercial
• Operating Supply Voltage (min): 3/4.5V
• Operating Supply Voltage (max): 3.6/5.5V
• Word Size: 8/16Bit
• Number Of Words: 2M/1M
• Supply Current: 60mA
• Mounting: Surface Mount
• Pin Count: 56
• Lead Free Status / Rohs Status: Not Compliant

16M (1M × 16, 2M × 8) Flash Memory
0.45
NOTE:
AC test inputs are driven at V
(0.45 V
and V
and fall times (10% to 90%) < 10 ns.
NOTE:
AC test inputs are driven at 3.0 V for a Logic '1' and 0.0 V for a
Logic '0'. Input timing begins and output timing ends at 1.5 V.
Input rise and fall times (10% to 90%) < 10 ns.
3.0
0.0
2.4
INPUT
INPUT
IL
TTL
(0.8 V
Reference Waveform (V
) for a Logic '0'. Input timing begins at V
Figure 7. Transient Input/Output
Figure 8. Equivalent Testing
TTL
Load Circuit (V
). Output timing ends at V
1.5
2.0
0.8
TEST POINTS
TEST POINTS
OH
(2.4 V
CC
TTL
= 3.3 V)
CC
) for a Logic '1' and V
IH
and V
= 5.0 V)
IH
IL
1.5
(2.0 V
. Input rise
2.0
0.8
28F016SUT-7
28F016SUT-6
OUTPUT
OUTPUT
TTL
)
OL
FROM OUTPUT
UNDER TEST
FROM OUTPUT
UNDER TEST
FROM OUTPUT
UNDER TEST
Figure 11. High Speed Transient Equivalent
Figure 10. Transient Equivalent Testing
Testing Load Circuit (V
Figure 9. Transient Equivalent Testing
Load Circuit (V
Load Circuit (V
2.5 ns OF 50
2.5 ns OF 25
2.5 ns OF 83
TOTAL CAPACITANCE = 100 pF
TOTAL CAPACITANCE = 50 pF
TOTAL CAPACITANCE = 30 pF
TRANSMISSION LINE
CC
CC
TRANSMISSION LINE
TRANSMISSION LINE
CC
= 3.3 V)
= 5.0 V)
= 5.0 V ± 5%)
LH28F016SU
28F016SUT-18
28F016SUT-8
28F016SUT-9
POINT
POINT
POINT
TEST
TEST
TEST
17