LFX125EB-04F256I LATTICE SEMICONDUCTOR, LFX125EB-04F256I Datasheet - Page 63

• Manufacturer Part Number: LFX125EB-04F256I
• Description: FPGA ispXPGA® Family 139K Gates 1936 Cells EECMOS Technology 2.5V/3.3V 256-Pin FBGA
• Manufacturer: LATTICE SEMICONDUCTOR

Specifications of LFX125EB-04F256I

• Package: 256FBGA
• Family Name: ispXPGA®
• Device Logic Units: 1936
• Device System Gates: 139000
• Number Of Registers: 3800
• Typical Operating Supply Voltage: 2.5|3.3 V
• Maximum Number Of User I/os: 160
• Ram Bits: 94208
• Re-programmability Support: Yes

Lattice Semiconductor
Switching Test Conditions
Figure 25 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 7.
Figure 25. Output Test Load, LVTTL and LVCMOS Standards
Table 7. Text Fixture Required Components
LVCMOS I/O, (L -> H, H -> L)
Default LVCMOS 1.8 I/O (Z -> H)
Default LVCMOS 1.8 I/O (Z -> L)
Default LVCMOS 1.8 I/O (H -> Z)
Default LVCMOS 1.8 I/O (L -> Z)
Note: Output test conditions for all other interfaces are determined by the respective standards.
Test Condition
Device
Output
*C
L
includes test fixture and probe capacitance.
106
106
106
R
×
×
1
106
106
106
R
×
×
2
35pF
35pF
35pF
5pF
5pF
C
L
V
R 1
R 2
59
CCO
LVCMOS 3.3 = V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
Timing Reference
C L *
V
V
OL
OH
0.9V
0.9V
+ 0.3
- 0.3
Point
Test
CCO
CCO
CCO
ispXPGA Family Data Sheet
/2
/2
/2
LVCMOS 1.8 = 1.65V
LVCMOS 3.3 = 3.0V
LVCMOS 2.5 = 2.3V
VCCO
1.65V
1.65V
1.65V
1.65V