M38510/20909BKA E2V, M38510/20909BKA Datasheet - Page 44

• Manufacturer Part Number: M38510/20909BKA
• Manufacturer: E2V

Specifications of M38510/20909BKA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

1/
2/
3/
4/
5/ GALPAT (PROGRAMMED PROM).
6/
7/ SEQUENTIAL (PROGRAMMED PROM).
This program will test all bits in the array, the addressing and interaction between bits for ac performance
t
shall be performed with V
When testing device type 10, the t
pattern outline in footnote 7/.
Description:
Step 1.
Step 2.
Step 3.
Step 4.
Step 5.
Step 6.
Step 7.
This program will test all bits in the array for t
V
Description:
Step 1.
Step 2.
Step 3.
Step 4.
Step 5.
PLH1
For programmed devices, select an appropriate address to acquire the desired output state.
For unprogrammed device types 01 (circuit A), apply 10.0 V on pin 1 (A
(circuit A), apply 13.0 V on pins 1 and 2 (A
and for the unprogrammed device type 04, apply 13.0 V on pins 1 and 2 (A
I
The functional tests shall verify that no fuses are blown for unprogrammed devices or that the truth table
All bits shall be tested. The functional tests shall be performed with V
Terminal conditions shall be as follows:
a.
b.
The outputs are loaded per figure 6.
CC
OL
specified in the altered item drawing exists for programmed devices (see table II and 3.3.2.2).
= 4.5 V and 5.5 V.
= 12 mA for circuits A, C, E, and G devices; I
Inputs: H = 3.0 V, L = 0.0 V.
Outputs: Output voltage shall be either:
(1)
(2)
and t
Each word in the pattern is tested from the enable lines to the output lines for recovery.
Word 0 is addressed. Enable line is pulled high to low and low to high. t
Word 1 is addressed. Same enable sequence as above.
The reading procedure continues until word 1023 or 2047 (as applicable) is reached.
Pass execution times 1024 or 2048 (as applicable) x cycle time.
PHL1
Word 0 is read.
Word 1 is read.
Word 0 is read
Word 2 is read.
Word 0 is read.
The reading procedure continues back and forth between word 0 and the next higher numbered word
until word 1023 or 2047 (as applicable) is reached, then increments to the next word and reads back
and forth as in step 1 through step 6 and shall include all words.
Pass execution time = ( n
H = 2.4 V minimum and L = 0.5 V maximum when using a high speed checker double comparator, or
H ≥ 1.0 V and L < 1.0 V when using a high speed checker single comparator.
. Each bit in the pattern is fixed by being programmed with an “H” or “L”. The GALPAT tests
CC
= 4.5 V and 5.5 V. For manufacturer-programmed PROM only (see 3.8.2).
TABLE III. Group A inspection – Continued.
PHL1
2
+ n ) x cycle time. n = 1024 or 2048 (as applicable).
and t
6
PLH1
, A
PHL2
MIL-M-38510/209E
5
); for unprogrammed device types 03, apply 10.0 V on pin 1 (A
OL
limits shall be verified by performing a sequential test
and t
= 16 mA for circuits B, D, and F devices.
44
PLH2
. The sequential tests shall be performed with
CC
6
) and for unprogrammed device type 02
= 4.5 V and V
7
, A
6
) (circuit A).
PHL2
CC
and t
= 5.5 V.
PLH2
are read.
7
)