M38510/20909BKA E2V, M38510/20909BKA Datasheet - Page 29

• Manufacturer Part Number: M38510/20909BKA
• Manufacturer: E2V

Specifications of M38510/20909BKA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM
plan shall not effect the form, fit, or function as described herein.
prior to qualification and quality conformance inspection. The following additional criteria shall apply:
manufacturer qualifies faster device type which is manufactured identically (for example, same die, process,
and package) to other device types on this specification, then the other device types may be qualified by
conducting only group A electrical tests and any electrical specified as additional group C subgroups and
submitting data in accordance with MIL-PRF-38535 (for example, groups B, C, and D tests are not
required).
with MIL-PRF-38535 and as specified herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
follows:
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
Qualification data for subgroups 7 through 11 shall be by attributes only.
4.3.1 Qualification extension. When authorized by the qualifying activity, for qualification inspection, if a
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as
c. Additional screening for space level product shall be as specified in MIL-PRF-38535, appendix B.
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical
d. Class B devices processed to an altered item drawing may be programmed either before or after
a. Electrical test requirements shall be as specified in table II herein.
b. Subgroups 4, 5, and 6 shall be omitted.
c. For unprogrammed devices, a sample shall be selected to satisfy programmability requirements prior
d. For unprogrammed devices, 10 devices from the programmability sample shall be subjected to the
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test
circuit shall be maintained under document control by the device manufacturer's Technology Review
Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or
preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power
dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-
883.
parameters test prior to burn-in is optional at the discretion of the manufacturer.
burn-in at the manufacturer’s discretion. The required electrical testing shall include, as a
minimum, the final electrical tests for programmed devices as specified in table II herein.
Class S devices processed by the manufacturer to an altered item drawing shall be programmed
prior to burn-in.
to performing subgroups 9, 10, and 11. Twelve devices shall be submitted to programming (see
3.3.2.1). If more than 2 devices fail to program, the lot shall be rejected, At the manufacturer’s
option, the sample may be increased to 24 total devices with no more than 4 total device failures
allowed.
requirements of group A, subgroups 9, 10, and 11. If more than two total devices fail in all three
subgroups, the lot shall be rejected. At the manufacturer’s option, the sample may be increased to 20
total devices with no more that 4 total device failures allowable.
MIL-M-38510/209E
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