M38510/20909BKA E2V, M38510/20909BKA Datasheet

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M38510/20909BKA

Manufacturer Part Number
M38510/20909BKA
Description
Manufacturer
E2V
Datasheet

Specifications of M38510/20909BKA

Lead Free Status / RoHS Status
Supplier Unconfirmed
thin film nichrome (NiCr) resistors, zapped vertical emitter, tungsten (W), titanium tungsten (TiW), or platinum silicide as the
fusible link or programming element. Two product assurance class and a choice of case outlines and lead finishes are
provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510
have been superseded by MIL-PRF-38535, (see 6.4).
AMSC N/A
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, PROM microcircuits which employ
1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types are as follows:
1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535.
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, P. O. Box 3990, Columbus, OH 43218-3990, or emailed to
memory@dscc.dla.mil. Since contact information can change, you may want to verify the currency of this
address information using the ASSIST Online database at
The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF-38535.
Device type
02, 08, 10
This specification is approved for use by all Departments and Agencies of the Department of Defense.
NOTE:
04, 09
01
03
05
06
PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON
2048 word / 4 bits per word PROM with uncommitted collector
2048 word / 4 bits per word PROM with active pullup and a third high-
impedance state output
1024 word / 8 bits per word PROM with uncommitted collector
1024 word / 8 bits per word PROM with active pullup and a third high-
impedance state output
1024 word / 8 bits per word PROM with active pullup and a third high-
impedance state output
1024 word / 8 bits per word PROM with uncommitted collector
Device type 07 was deleted from this document under revision D.
MICROCIRCUIT, DIGITAL, 8192-BIT, SCHOTTKY, BIPOLAR,
Inactive for new design after 24 July 1995
MILITARY SPECIFICATION
Circuit
http://assist.daps.dla.mil
MIL-M-38510/209E
23 February 2006
SUPERSEDING
MIL-M-38510/209D
30 September 1986
Access time (ns)
FSC 5962
125, 90, 55
INCH-POUND
90, 55
125
90
90
90

Related parts for M38510/20909BKA

M38510/20909BKA Summary of contents

Page 1

MICROCIRCUIT, DIGITAL, 8192-BIT, SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON This specification is approved for use by all Departments and Agencies of the Department of Defense. The requirements for acquiring the product herein shall consist of this specification sheet ...

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Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator J GDIP1-T24 or CDIP2-T24 K GDFP2-F24 or CDFP3-F24 V GDIP1-T18 or CDIP2-T18 X See figure 1 Y GDFP2-F18 1.3 Absolute maximum ratings. ...

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APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections this specification. This section does not include documents cited in other sections of this specification or recommended for additional information ...

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Functional block diagram. The functional block diagram shall be as specified on figure 4. 3.3.4 Case outlines. The case outlines shall be as specified in 1.2.3. 3.4 Lead material and finish. The lead material and finish shall be in ...

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TABLE I Test Symbol High-level output voltage Low-level output voltage 2/ Input clamp voltage Maximum collector cut-off current High impedance (off-state) output high current High impedance (off-state) output low current High level input current Low level input current Short circuit ...

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TABLE I Test Symbol Propagation delay time, low to high level logic, address to output Propagation delay time, high to low level logic, enable to output Propagation delay time, low to high level logic, enable to output 1/ Complete terminal ...

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MIL-M-38510/209E FIGURE 1. Case outline X. 7 ...

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Symbol Min A .045 b .015 C .003 D .340 E .340 E 1 .260 E 2 .025 .050 K .008 L .250 Q .010 .005 S 1 .004 S 2 α 30° NOTES: 1. Index area; ...

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MIL-M-38510/209E Device types 01, 02, 08, and 10 Case outlines Terminal number GND ...

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MIL-M-38510/209E Device types 05 and 06 Case outlines J and K Terminal number ...

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Device types 01, 02, 08, and 10 ( see notes 1, 2, and 3 ) Word Enable number Word Data number ...

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Device types 03, 04, and 09 ( see notes and 4 ) Word Enable number ...

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MIL-M-38510/209E Device types 01, 02, and 08 (Circuit B) Device types 01 and 02 (Circuit A) Device type 02 (Circuit F) Device types 03 and 04 (Circuit E) FIGURE 4. Functional block diagrams. 13 ...

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MIL-M-38510/209E Device types 01, 02, and 10 Circuit C FIGURE 4. Functional block diagrams – Continued. 14 ...

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MIL-M-38510/209E Device types 03 and 04 Circuit A FIGURE 4. Functional block diagrams – Continued. 15 ...

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MIL-M-38510/209E FIGURE 4. Functional block diagrams – Continued. 16 ...

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MIL-M-38510/209E Device type 04 Circuit F FIGURE 4. Functional block diagrams – Continued. 17 ...

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MIL-M-38510/209E Device types 03, 04, 05, and 09 Circuit C FIGURE 4. Functional block diagrams – Continued. 18 ...

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MIL-M-38510/209E Device types 03, 04, 05, 06, and 09 Circuits B and D FIGURE 4. Functional block diagrams – Continued. 19 ...

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NOTE: All other waveform characteristics shall be as specified in table IVA. FIGURE 5A. Programming voltage waveforms during programming for circuit A. NOTES: 1. Output load is 0.2 mA and 12 mA during 7.0 V and 4.0 V check, respectively. ...

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FIGURE 5B. Programming voltage waveforms during programming for circuit B – Continued. MIL-M-38510/209E 21 ...

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MIL-M-38510/209E NOTE: All other waveform characteristics shall be as specified in table IVC. FIGURE 5C. Programming voltage waveforms during programming for circuit C. NOTE: All other waveform characteristics shall be as specified in table IVD. FIGURE 5D. Programming voltage waveforms ...

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NOTES: 1. All delays between edges are specified from completion of the first edge, not midpoints. must be greater than 100 ns; maximum delays of 1 µs are recommended 2. Delays and t 1 ...

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NOTES: 1. Output load is 0.2 mA and 12 mA during 6.2 V and 4.2 V check, respectively. 2. All other waveform characteristics shall be as specified in table IVF. FIGURE 5F. Programming voltage waveforms during programming for circuit F. ...

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MIL-M-38510/209E FIGURE 5G. Programming voltage waveforms during programming for circuit G. 25 ...

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NOTES: 1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent tests which apply to the specific program configuration for the resulting read-only memory minimum, including ...

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NOTES: 1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent tests which apply to the specific program configuration for the resulting read-only memory minimum, including ...

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NOTES: 1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent tests which apply to the specific program configuration for the resulting read-only memory minimum, including ...

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VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF- 38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, ...

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MIL-PRF-38535 test requirements Interim electrical parameters Final electrical test parameters for unprogrammed devices Final electrical test parameters for programmed devices Group A test requirements Group B end-point electrical parameters subgroup 5 when using the method 5005 QCI option Group C ...

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Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high ≥ 2.0 V, low ≤ 0 open). MIL- Cases STD- V,X Subgroup Symbol 883 Test ...

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Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high ≥ 2.0 V, low ≤ 0 open). MIL- Cases STD- V,X Subgroup Symbol 883 Test ...

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Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high ≥ 2.0 V, low ≤ 0 open). MIL- Cases STD- V,X,Y Subgroup Symbol 883 Test ...

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TABLE III. Group A inspection for device types 02, 08, and 10 – Continued. Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high ≥ 2.0 V, low ≤ 0.8 V, ...

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Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high ≥ 2.0 V, low ≤ 0 open). MIL- Cases STD- J,K Subgroup Symbol 883 ...

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Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high ≥ 2.0 V, low ≤ 0 open). MIL- Cases STD- J,K Subgroup Symbol 883 ...

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Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high ≥ 2.0 V, low ≤ 0 open). MIL- Cases STD- J,K Subgroup Symbol 883 ...

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Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high ≥ 2.0 V, low ≤ 0 open). MIL- Cases STD- J,K Subgroup Symbol 883 ...

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Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high ≥ 2.0 V, low ≤ 0 open). MIL- Cases STD- J,K Subgroup Symbol 883 ...

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Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high ≥ 2.0 V, low ≤ 0 open). Subgroup Symbol MIL- Cases STD- J,K ...

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Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high ≥ 2.0 V, low ≤ 0 open). MIL- Cases STD- J,K Subgroup Symbol 883 ...

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Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high ≥ 2.0 V, low ≤ 0 open). Subgroup Symbol MIL- Cases STD- J,K 883 ...

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Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high ≥ 2.0 V, low ≤ 0 open). Subgroup Symbol MIL- Cases STD- J,K 883 ...

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For programmed devices, select an appropriate address to acquire the desired output state. 2/ For unprogrammed device types 01 (circuit A), apply 10 pin 1 (A (circuit A), apply 13 pins 1 and 2 (A ...

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Device type 01, 02 03, 04, 05, 06 Circuit F Circuit B device For unprogrammed devices (circuit C), apply 10 pin 15 (A address pins for device types 02 and 10; device types ...

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Programming procedure identification. The programming procedure to be utilized shall be identified by the manufacturer’s circuit designator. The circuit designator is cross referenced in paragraph 6.7 herein with the manufacturer’s symbol or CAGE number. 4.7 Programming procedure for circuit ...

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TABLE IVA. Programming characteristics for circuit A. 1/ Parameter Symbol V Address input voltage 3/ V Programming V PH Voltage to V low Program verify V PHV Verify voltage V R Programming input low I ILP current ...

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Programming procedure for circuit B, device types 03 and 04. The waveforms on figure 5B, the programming characteristics in table IVB and the following procedures shall apply for programming the device: a. Connect the device in the electrical configuration ...

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TABLE IVB. Programming characteristics for circuit B, device types 03 and 04. Parameter Symbol V required during CC V CCP programming Rise time of programming pulse to t TLH data out or programming pin Programming voltage programming ...

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Programming procedure for circuit B, device types 01, 02, and 08. The waveforms on figure 5B, (device types 01, 02, and 08), the programming characteristics in table IVB (device types 01, 02, and 08), and the following procedures shall ...

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TABLE IVB. Programming characteristics for circuit B, device types 01, 02, and 08. Parameter Symbol V required during CC V CCP programming V current limit OUT I OP during programming Output programming V OUT voltage Pulse width ...

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Programming procedure for circuit C. The waveforms on figure 5C, the programming characteristics in table IVC and the following procedures shall apply for programming the device: a. Connect the device in the electrical configuration for programming. b. Terminate all ...

Page 53

TABLE IVC. Programming characteristics for circuit C. Parameter Symbol Programming voltage V CCP Verification upper limit V CCH Verification lower limit V CCL Verify threshold V S Programming supply I CCP current Input voltage high level V IH “1” Input ...

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Programming procedure for circuit D. The waveforms on figure 5D, the programming characteristics in table IVD and the following procedures shall apply for programming the device: a. Connect the device in the electrical configuration for programming. b. Select the ...

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TABLE IVD. Programming characteristics for circuit D. Parameter Symbol Address input voltage Chip enable V P(CE) programming voltage Programming voltage V OP(max) limit Power supply V CC Power supply current I CC Chip enable current I ...

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TABLE IVD. Programming characteristics for circuit D – Continued. Parameter Symbol Delay to V off Delay to read before t dRBP programming Width to read compare t W strobe Voltage change programming ...

Page 57

Programming procedure for circuit E. The waveforms on figure 5E, the programming characteristics in table IVE and the following procedures shall apply for programming the device: a. Connect the device in the electrical configuration for programming. b. Terminate all ...

Page 58

TABLE IVE. Programming characteristics for circuit E. Parameter Symbol V required during CC V CCP programming High level input voltage V IHP during programming Low level input voltage V ILP during programming Chip enable voltage V CEP during programming Output ...

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Programming procedure for circuit F. The waveforms on figure 5F, the programming characteristics in table IVF and the following procedures shall apply for programming the device: a. Connect the device in the electrical configuration for programming. b. Raise V ...

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TABLE IVF. Programming characteristics for circuit F. Parameter Symbol V required during CC V CCP programming Rise time of programming pulse to t TLH data out or programming pin Programming voltage programming pin Output programming V OUT ...

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Programming procedure for circuit G. The waveforms on figure 5G, the programming characteristics in table IVG and the following procedures shall apply for programming the device: a. Connect the device in the electrical configuration for programming. b. Select the ...

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TABLE IVG. Programming characteristics for circuit G. Parameter Symbol Required V for V CC CCP programming I CCP I during programming CC Required output voltage V OP for programming Output current while I OP programming Rate of voltage change I ...

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PACKAGING 5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When packaging of materiel performed by DoD or in-house contractor personnel, these personnel need to ...

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Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M- 38510 in this document have been replaced by appropriate references to MIL-PRF-38535. ...

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Military device type 7681 / Harris Semiconductor / CAGE 34371 04, 09 04, 09 93Z451 / Fairchild Corporation / CAGE 07263 27S181 / Advanced Micro Devices, Inc 29631 / Raytheon Company / CAGE 07933 ...

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