AFCT-5815CZ Avago Technologies US Inc., AFCT-5815CZ Datasheet - Page 6

TXRX OPT SM 155MBS SONET OC3/SDH

AFCT-5815CZ

Manufacturer Part Number
AFCT-5815CZ
Description
TXRX OPT SM 155MBS SONET OC3/SDH
Manufacturer
Avago Technologies US Inc.
Datasheet

Specifications of AFCT-5815CZ

Applications
General Purpose
Data Rate
155Mbps
Wavelength
1300nm
Voltage - Supply
*
Connector Type
SC
Mounting Type
Through Hole
Data Rate Max
0.155Gbps
Supply Voltage
5V
Wavelength Typ
1300nm
Leaded Process Compatible
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Regulatory Compliance
The AFCT-5815xZ is intended to enable
commercial system designers to develop
equipment that complies with the various
regulations governing certification of Information
Technology Equipment. See the Regulatory
Compliance Table 1 for details. Additional
information is available from your Avago
Technologies sales representative.
Electrostatic Discharge (ESD)
There are two design cases in which immunity
to ESD damage is important.
The first case is during handling of the
transceiver prior to mounting it on the circuit
board. It is important to use normal ESD
handling precautions for ESD sensitive devices.
These precautions include using grounded wrist
straps, work benches and floor mats in ESD
controlled areas.
The second case to consider is static discharges
to the exterior of the equipment chassis
containing the transceiver parts. To the extent
that the duplex SC connector is exposed to the
outside of the equipment chassis it may be
subject to whatever ESD system level test criteria
that the equipment is intended to meet.
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Electromagnetic Interference (EMI)
Most equipment designs utilizing these high-speed
transceivers from Avago Technologies will be
required to meet the requirements of FCC in
the United States, CENELEC EN55022 (CISPR
22) in Europe and VCCI in Japan.
The AFCT-5815xZ has been characterized without
a chassis enclosure to demonstrate the
robustness of the part’s integral shielding.
Performance of a system containing these
transceivers within a well designed chassis is
expected to be better than the results of these
tests with no chassis enclosure.
Immunity
E q u i p m e n t u t i l i z i n g t h e s e A F C T - 5 8 1 5 x Z
transceivers will be subject to radio-frequency
electromagnetic fields in some environments.
These transceivers, with their integral shields,
have been characterized without the benefit of
a normal equipment chassis enclosure and the
results are reported below. Performance of a
system containing these transceivers within a
well designed chassis is expected to be better
than the results of these tests without a chassis
enclosure.

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