MC33883DW Freescale Semiconductor, MC33883DW Datasheet - Page 4
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MC33883DW
Manufacturer Part Number
MC33883DW
Description
IC H-BRIDGE PRE-DRIVER 20-SOIC
Manufacturer
Freescale Semiconductor
Datasheet
1.MCZ33883EGR2.pdf
(21 pages)
Specifications of MC33883DW
Configuration
H Bridge
Input Type
Non-Inverting
Delay Time
200ns
Current - Peak
2A
Number Of Configurations
1
Number Of Outputs
4
Voltage - Supply
5.5 V ~ 55 V
Operating Temperature
-40°C ~ 125°C
Mounting Type
Surface Mount
Package / Case
20-SOIC (7.5mm Width)
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
High Side Voltage - Max (bootstrap)
-
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MC33883DW
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Part Number:
MC33883DWR2
Manufacturer:
FREESCALE
Quantity:
20 000
Table 2. Maximum Ratings
permanent damage to the device.
4
33883
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL RATINGS
Notes
Supply Voltage 1
Supply Voltage 2
Linear Regulator Output Voltage
High-Side Floating Supply Absolute Voltage
High-Side Floating Source Voltage
High-Side Source Current from CP_OUT in Switch ON State
High-Side Gate Voltage
High-Side Gate Source Voltage
High-Side Floating Supply Gate Voltage
Low-Side Gate Voltage
Wake-Up Voltage
Logic Input Voltage
Charge Pump Capacitor Voltage
Charge Pump Capacitor Voltage
ESD Voltage
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
1.
2.
3.
Human Body Model on All Pins (V
Supplies)
Machine Model
V
In case of high current (SRC_HS >100 mA) and high voltage (>20 V) between GATE_HSX and SRC_HS an external zener of 18 V is
needed as shown in
ESD1 testing is performed in accordance with the Human Body Model (C
accordance with the Machine Model (C
CC2
can sustain load dump pulse of 40 V, 400 ms, 2.0 Ω.
(3)
(1)
Figure
Rating
(2)
14.
CC
and V
ELECTRICAL CHARACTERISTICS
ZAP
CC2
= 200 pF, R
as Two Power
MAXIMUM RATINGS
ZAP
= 0 Ω).
V
V
V
V
V
V
V
V
V
GATE_HS
Symbol
GATE_HS
CP_OUT
GATE_HS
GATE_LS
V
V
V
LR_OUT
CP_OUT
SRC_HS
SRC_HS
V
V
G_EN
V
V
ZAP
ESD1
ESD2
V
CC2
I
CC
C1
C2
S
IN
= 100 pF, R
-
-
ZAP
Analog Integrated Circuit Device Data
= 1500 Ω), ESD2 testing is performed in
-0.3 to V
-0.3 to 65
-0.3 to 35
-0.3 to 18
-0.3 to 65
-2.0 to 65
-0.3 to 65
-0.3 to 20
-0.3 to 65
-0.3 to 17
-0.3 to 35
-0.3 to 10
-0.3 to 65
Value
±1500
±130
250
LR_OUT
Freescale Semiconductor
Unit
mA
V
V
V
V
V
V
V
V
V
V
V
V
V
V