CAT28F010G12 ON Semiconductor, CAT28F010G12 Datasheet - Page 5

• Manufacturer Part Number: CAT28F010G12
• Description: IC FLASH 1MBIT 120NS 32PLCC
• Manufacturer: ON Semiconductor

Specifications of CAT28F010G12

• Format - Memory: FLASH
• Memory Type: FLASH
• Memory Size: 1M (128K x 8)
• Speed: 120ns
• Interface: Parallel
• Voltage - Supply: 4.5 V ~ 5.5 V
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 32-PLCC
• Density: 1Mb
• Access Time (max): 120ns
• Interface Type: Parallel
• Boot Type: Not Required
• Address Bus: 17b
• Operating Supply Voltage (typ): 5V
• Operating Temp Range: 0C to 70C
• Package Type: PLCC
• Program/erase Volt (typ): 11.4 to 12.6V
• Sync/async: Asynchronous
• Operating Temperature Classification: Commercial
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Word Size: 8b
• Number Of Words: 128K
• Supply Current: 30mA
• Mounting: Surface Mount
• Pin Count: 32
• Data Bus Width: 8 bit
• Architecture: Non Sectored
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 4.5 V
• Maximum Operating Current: 30 mA
• Mounting Style: SMD/SMT
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: CAT28F010G-12; CAT28F010G-12

SUPPLY CHARACTERISTICS
A.C. CHARACTERISTICS, Read Operation
V
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) Output floating (High-Z) is defined as the state where the external data line is no longer driven by the output buffer.
(3) Input Rise and Fall Times (10% to 90%) < 10 ns.
(4) Input Pulse Levels = 0.45V and 2.4V. For High Speed Input Pulse Levels 0.0V and 3.0V.
(5) Input and Output Timing Reference = 0.8V and 2.0V. For High Speed Input and Output Timing Reference = 1.5V.
(6) Low-Z is defined as the state where the external data may be driven by the output buffer but may not be valid.
(7)
© 2009 SCILLC. All rights reserved.
Characteristics subject to change without notice
JEDEC Standard
Symbol Symbol
t
WHGL
CC
t
t
t
t
t
t
t
t
t
AVQV
GLQV
AXQX
GLQX
GHQZ
EHQZ
AVAV
ELQV
ELZX
For load and reference points, see Fig. 1
Symbol
= +5V 10%, unless otherwise specified.
V
V
V
(1)
CC
PPL
PPH
t
t
t
OLZ
t
DF
DF
LZ
t
t
t
ACC
t
t
RC
OE
OH
CE
(1)(6)
(1)(2)
(1)(2)
(1)(6)
-
Parameter
Read Cycle Time
CE Access Time
Address Access Time
OE Access Time
Output Hold from Address OE/CE Change
OE to Output in Low-Z
CE to Output in Low-Z
OE High to Output High-Z
CE High to Output High-Z
Write Recovery Time Before Read
V
V
V
CC
PP
PP
During Read Operations
During Read/Erase/Program
Supply Voltage
Figure 1. A.C. Testing Input/Output Waveform
0.45 V
2.4 V
DEVICE
UNDER
TEST
Parameter
Testing Load Circuit (example)
INPUT PULSE LEVELS
5108 FHD F04
1.3V
1N914
3.3K
C L = 100 pF
5
2.0 V
0.8 V
C L INCLUDES JIG CAPACITANCE
OUT
REFERENCE POINTS
Min
90
28F010-90
0
0
0
6
11.4
Min
4.5
0
Max
90
90
35
20
30
(7)
5108 FHD F03
Limits
(3)(4)(5)
28F010-12
Min
120
0
0
0
6
Max.
12.6
5.5
6.5
120
120
Max
50
30
40
(7)
Doc. No. MD-1019, Rev. G
CAT28F010
Unit
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
V
V
V
s