EVAL-ADXL312Z Analog Devices, EVAL-ADXL312Z Datasheet - Page 4

• Manufacturer Part Number: EVAL-ADXL312Z
• Description: Daughter Cards & OEM Boards EB Digital Output Three-Axis Accel
• Manufacturer: Analog Devices
• Series: ADXL312r

Specifications of EVAL-ADXL312Z

• Rohs: yes
• Product: Evaluation Boards
• Description/function: 3 axis accelerometer evaluation board
• Interface Type: I2C, SPI
• Maximum Operating Temperature: + 105 C
• Minimum Operating Temperature: - 40 C
• Operating Supply Voltage: 2 V to 3.6 V
• Factory Pack Quantity: 1
• For Use With: ADXL312

ADXL312
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All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed.
Cross-axis sensitivity is defined as coupling between any two axes.
Bandwidth is half the output data rate.
Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register) minus the output (g) when the SELF_TEST bit = 0 (in the
DATA_FORMAT register). Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate).
Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For
other data rates, the turn-on and wake-up times are each approximately τ + 1.1 in milliseconds, where τ = 1/(data rate).
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