CY7C1512AV18-200BZXC Cypress Semiconductor Corp, CY7C1512AV18-200BZXC Datasheet - Page 19

• Manufacturer Part Number: CY7C1512AV18-200BZXC
• Description: IC SRAM 72MBIT 200MHZ 165TFBGA
• Manufacturer: Cypress Semiconductor Corp

Specifications of CY7C1512AV18-200BZXC

• Format - Memory: RAM
• Memory Type: SRAM - Synchronous, QDR II
• Memory Size: 72M (4M x 18)
• Speed: 200MHz
• Interface: Parallel
• Voltage - Supply: 1.7 V ~ 1.9 V
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 165-TFBGA
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Electrical Characteristics
DC Electrical Characteristics
Over the Operating Range
AC Electrical Characteristics
Over the Operating Range
Capacitance
Tested initially and after any design or process change that may affect these parameters.
Thermal Resistance
Tested initially and after any design or process change that may affect these parameters.
Document #: 001-06984 Rev. *E
I
V
V
C
C
C
Note
SB1
Parameter
Parameter
Parameter
Parameter
20. Unless otherwise noted, test conditions are based on signal transition time of 2V/ns, timing reference levels of 0.75V, Vref = 0.75V, RQ = 250Ω, V
IH
IL
IN
CLK
O
pulse levels of 0.25V to 1.25V, and output loading of the specified I
OUTPUT
DEVICE
UNDER
TEST
Θ
Θ
JA
JC
V
(a)
REF
ZQ
Automatic Power down
Current
Input HIGH Voltage
Input LOW Voltage
Input Capacitance
Clock Input Capacitance
Output Capacitance
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
Z
RQ =
250Ω
0.75V
0
= 50Ω
Description
Description
Description
Description
[12]
[11]
V
REF
R
L
= 0.75V
= 50Ω
(continued)
Max V
Both Ports Deselected,
V
f = f
Inputs Static
Figure 4. AC Test Loads and Waveforms
IN
INCLUDING
≥ V
MAX
T
Test conditions follow standard test methods and
procedures for measuring thermal impedance, in
accordance with EIA/JESD51.
DEVICE
UNDER
TEST
OUTPUT
A
DD
JIG AND
IH
SCOPE
= 25°C, f = 1 MHz, V
= 1/t
V
,
or V
REF
ZQ
Test Conditions
OL
CYC
IN
/I
Test Conditions
OH
≤ V
,
and load capacitance shown in (a) of
0.75V
RQ =
250Ω
IL
Test Conditions
Test Conditions
V
(b)
REF
250 MHz (x18)
200 MHz (x18)
167 MHz (x18)
= 0.75V
DD
R = 50Ω
5 pF
= 1.8V, V
(x36)
(x36)
(x36)
0.25V
DDQ
V
= 1.5V
REF
AC Test Loads and
Min
Min
1.25V
–
+ 0.2
SLEW RATE= 2 V/ns
ALL INPUT PULSES
0.75V
165 FBGA
Package
Typ
Typ
CY7C1512AV18
CY7C1514AV18
–
–
Max
16.3
5.5
8.5
2.1
Waveforms.
6
V
REF
Max
Max
400
450
380
400
360
370
–
[20]
– 0.2
DDQ
Page 19 of 24
= 1.5V, input
°C/W
°C/W
Unit
Unit
pF
pF
pF
Unit
Unit
mA
V
V
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