CY62128EV30LL-45ZXI Cypress Semiconductor Corp, CY62128EV30LL-45ZXI Datasheet - Page 5

• Manufacturer Part Number: CY62128EV30LL-45ZXI
• Description: IC SRAM 1MBIT 45NS 32TSOP
• Manufacturer: Cypress Semiconductor Corp
• Type: Asynchronousr

Specifications of CY62128EV30LL-45ZXI

• Memory Size: 1M (128K x 8)
• Package / Case: 32-TSOP I
• Format - Memory: RAM
• Memory Type: SRAM
• Speed: 45ns
• Interface: Parallel
• Voltage - Supply: 2.2 V ~ 3.6 V
• Operating Temperature: -40°C ~ 85°C
• Access Time: 45 ns
• Supply Voltage (max): 3.6 V
• Supply Voltage (min): 2.2 V
• Maximum Operating Current: 16 mA
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Mounting Style: SMD/SMT
• Number Of Ports: 1
• Operating Supply Voltage: 2.5 V, 3.3 V
• Density: 1Mb
• Access Time (max): 45ns
• Sync/async: Asynchronous
• Architecture: Not Required
• Clock Freq (max): Not RequiredMHz
• Operating Supply Voltage (typ): 3V
• Address Bus: 17b
• Package Type: TSOP-I
• Operating Temp Range: -40C to 85C
• Supply Current: 16mA
• Operating Supply Voltage (min): 2.2V
• Operating Supply Voltage (max): 3.6V
• Operating Temperature Classification: Industrial
• Mounting: Surface Mount
• Pin Count: 32
• Word Size: 8b
• Number Of Words: 128K
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant
• Other names: 428-2067; CY62128EV30LL-45ZXI

Capacitance
Thermal Resistance
Data Retention Characteristics
(Over the Operating Range)
Note
Document #: 38-05579 Rev. *I
C
C
V
I
t
t
Parameter
Parameter
9. Tested initially and after any design or process changes that may affect these parameters.
10. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V
11. Chip enables (CE
12. Full device AC operation requires linear V
CCDR
CDR
R
Parameter
DR
IN
OUT
[12]


[9]
[11]
JA
JC
OUTPUT
INCLUDING
[9]
[9]
V
JIG AND
CC
Thermal resistance
(junction to ambient)
Thermal resistance
(junction to case)
SCOPE
V
Data retention current
Chip deselect to data retention time
Operation recovery time
Input capacitance
Output capacitance
CC
1
30 pF
and CE
for data retention
Parameters
Description
Description
R
V
R1
R1
R2
2
TH
TH
) must be at CMOS level to meet the I
Description
R2
CC
Equivalent to:
ramp from V
Still air, soldered on a 3 x 4.5 inch,
two-layer printed circuit board
T
V
A
CC
Figure 4. AC Test Loads and Waveforms
= 25 °C, f = 1 MHz,
= V
OUTPUT
CC(typ)
DR
Test Conditions
Test Conditions
V
CE
V
to V
CC
IN
Rise Time = 1 V/ns
1
CC(min)
> V
SB2
> V
= 1.5 V,
THEVENIN
/ I
CC
CC
CCDR
> 100 µs or stable at V
16667
15385
GND
2.50V
8000
 0.2 V or CE
0.2 V or V
1.20
V
CC
spec. Other inputs can be left floating.
EQUIVALENT
R
TH
10%
Conditions
IN
2
ALL INPUT PULSES
< 0.2 V
< 0.2 V,
CC(min)
V
TSOP I
90%
33.01
3.42
 100 µs.
1103
1554
Max
3.0V
1.75
645
10
10
Industrial
CC
25.86
SOIC
48.67
= V
CY62128EV30 MoBL
90%
CC(typ)
10%
Fall Time = 1 V/ns
, T
A
Min
1.5
45
= 25 °C.
–
0
STSOP
32.56
3.59
Typ
–
–
–
–
Unit
Unit
[10]
pF
pF



V
Page 5 of 15
Max Unit
–
3
–
–
°C/W
°C/W
Unit
µA
ns
ns
V
®
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