AT93C46D-TH-B Atmel, AT93C46D-TH-B Datasheet - Page 2

• Manufacturer Part Number: AT93C46D-TH-B
• Description: IC EEPROM 1KBIT 2MHZ 8TSSOP
• Manufacturer: Atmel

Specifications of AT93C46D-TH-B

• Format - Memory: EEPROMs - Serial
• Memory Type: EEPROM
• Memory Size: 1K (128 x 8 or 64 x 16)
• Speed: 250kHz, 1MHz, 2MHz
• Interface: 3-Wire Serial
• Voltage - Supply: 1.8 V ~ 5.5 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 8-TSSOP
• Organization: 128 K x 8 or 64 K x 16
• Interface Type: 3-Wire
• Maximum Clock Frequency: 2 MHz
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 1.8 V
• Maximum Operating Current: 2 mA
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 40 C
• Operating Supply Voltage: 1.8 V, 5.5 V
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

1. Absolute Maximum Ratings*
2
Operating Temperature......................................−55°C to +125°C
Storage Temperature .........................................−65°C to +150°C
Voltage on Any Pin
with Respect to Ground ........................................ −1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
AT93C46D
Figure 1-1.
Notes:
1. When the ORG pin is connected to VCC, the “x 16” organization is selected. When it is con-
2. For the AT93C46D, if the “x 16” organization is the mode of choice and pin 6 (ORG) is left
nected to ground, the “x 8” organization is selected. If the ORG pin is left unconnected and the
application does not load the input beyond the capability of the internal 1 Meg ohm pullup, then
the “x 16” organization is selected.
unconnected, Atmel
AT93C46E datasheet.
Block Diagram
®
recommends using AT93C46E device. For more details, see the
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only, and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability
5193F–SEEPR–1/08