MK10DX128VLF5 Freescale Semiconductor, MK10DX128VLF5 Datasheet - Page 22

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MK10DX128VLF5

Manufacturer Part Number
MK10DX128VLF5
Description
ARM Microcontrollers - MCU Kinetis 128K Flex
Manufacturer
Freescale Semiconductor
Datasheet

Specifications of MK10DX128VLF5

Rohs
yes
Core
ARM Cortex M4
Processor Series
K10P32M50SF0
Data Bus Width
32 bit
Maximum Clock Frequency
50 MHz
Program Memory Size
128 KB
Data Ram Size
16 KB
On-chip Adc
Yes
Operating Supply Voltage
1.71 V to 3.6 V
Operating Temperature Range
- 40 C to + 105 C
Package / Case
LQFP-48
Mounting Style
SMD/SMT

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Peripheral operating requirements and behaviors
1.
2.
3.
5.
6.
7.
6 Peripheral operating requirements and behaviors
6.1 Core modules
6.1.1 JTAG electricals
22
Single-layer (1s)
Four-layer (2s2p)
Board type
Symbol
Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site
(board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board
thermal resistance.
Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air) with the single layer board horizontal. For the LQFP, the board meets the
JESD51-3 specification. For the MAPBGA, the board meets the JESD51-9 specification.
Determined according to JEDEC Standard JESD51-6, Integrated Circuits Thermal Test Method Environmental
Conditions—Forced Convection (Moving Air) with the board horizontal.
Determined according to JEDEC Standard JESD51-8, Integrated Circuit Thermal Test Method Environmental
Conditions—Junction-to-Board. Board temperature is measured on the top surface of the board near the package.
Determined according to Method 1012.1 of MIL-STD 883, Test Method Standard, Microcircuits, with the cold plate
temperature used for the case temperature. The value includes the thermal resistance of the interface material
between the top of the package and the cold plate.
Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air).
Operating voltage
Description
R
R
R
R
Ψ
Symbol
θJMA
θJMA
θJB
θJC
JT
Table 12. JTAG voltage range electricals
K10 Sub-Family Data Sheet, Rev. 4 5/2012.
Thermal
resistance, junction
to ambient (200 ft./
min. air speed)
Thermal
resistance, junction
to ambient (200 ft./
min. air speed)
Thermal
resistance, junction
to board
Thermal
resistance, junction
to case
Thermal
characterization
parameter, junction
to package top
outside center
(natural
convection)
Description
Table continues on the next page...
78
27
12
1.5
6
32 QFN
Min.
°C/W
°C/W
°C/W
°C/W
°C/W
2.7
Unit
Freescale Semiconductor, Inc.
Max.
5.5
1,3
,
5
6
7
Notes
Unit
V

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