ispLSI 1048-50LQ Lattice, ispLSI 1048-50LQ Datasheet - Page 5

• Manufacturer Part Number: ispLSI 1048-50LQ
• Description: CPLD - Complex Programmable Logic Devices USE ispMACH 4000V
• Manufacturer: Lattice

Output Load Conditions (see figure 2)
3-state levels are measured 0.5V from steady-state
active level.
1. One output at a time for a maximum duration of one second. V
2. Measured using twelve 16-bit counters.
3. Typical values are at V
4. Maximum I
SYMBOL
Switching Test Conditions
DC Electrical Characteristics
V
V
I
I
I
I
I
I
Test Condition
A
B
C
Input Pulse Levels
Input Rise and Fall Time
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
degradation. Characterized but not 100% tested.
tion of this datasheet and Thermal Management section of this Lattice Semiconductor Data Book or CD-ROM to estimate maximum
I
CC
IL
IH
IL-isp
IL-PU
OS
CC
OL
OH
.
2,4
1
Active High
Active Low
Active High to Z
at V
Active Low to Z
at V
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
isp Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
OH
OL
CC
+ 0.5V
- 0.5V
varies widely with specific device configuration and operating frequency. Refer to the Power Consumption sec-
PARAMETER
CC
= 5V and T
470Ω
470Ω
470Ω
R1
∞
∞
Over Recommended Operating Conditions
A
= 25
≤ 3ns 10% to 90%
390Ω
390Ω
390Ω
390Ω
390Ω
R2
GND to 3.0V
See figure 2
o
C.
1.5V
1.5V
I
I
0V ≤ V
3.5V ≤ V
0V ≤ V
0V ≤ V
V
V
f
OL
OH
TOGGLE
CC
IL
=8 mA
=-4 mA
= 0.5V, V
35pF
35pF
35pF
Table 2- 0003
5pF
5pF
= 5V, V
CL
IN
IN
IN
= 1 MHz
IN
≤ V
≤ V
≤ V
≤ V
OUT
CONDITION
4
IL
IL
IL
IH
(MAX.)
(MAX.)
CC
Figure 2. Test Load
= 3.0V
out
= 0.5V
= 0.5V was selected to avoid test problems by tester ground
*
Device
Output
C L includes Test Fixture and Probe Capacitance.
Specifications ispLSI 1048
Commercial
Industrial
MIN.
+ 5V
2.4
–
–
–
–
–
–
–
–
R 1
R 2
TYP.
165
165
–
–
–
–
–
–
–
3
C L
MAX.
-150
-150
-200
235
260
-10
0.4
*
10
–
Table 2- 0007A-48-isp
UNITS
Point
Test
V
V
μA
μA
μA
μA
mA
mA
mA