K6R1004C1C SAMSUNG [Samsung semiconductor], K6R1004C1C Datasheet - Page 6

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K6R1004C1C

Manufacturer Part Number
K6R1004C1C
Description
256Kx4 Bit (with OE) High-Speed CMOS Static RAM(5.0V Operating).
Manufacturer
SAMSUNG [Samsung semiconductor]
Datasheet

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Company
Part Number
Manufacturer
Quantity
Price
Part Number:
K6R1004C1C-JC15
Manufacturer:
SAMSUNG
Quantity:
351
K6R1004C1C-C/C-L, K6R1004C1C-I/C-P
TIMING WAVEFORM OF WRITE CYCLE(2)
TIMING WAVEFORM OF WRITE CYCLE(1)
Address
CS
WE
Data in
Data out
Address
CS
WE
Data in
Data out
OE
NOTES(READ CYCLE)
1. WE is high for read cycle.
2. All read cycle timing is referenced from the last valid address to the first transition address.
3. t
4. At any given temperature and voltage condition, t
5. Transition is measured 200mV from steady state voltage with Load(B). This parameter is sampled and not 100% tested.
6. Device is continuously selected with CS=V
7. Address valid prior to coincident with CS transition low.
8. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and write cycle.
V
device.
HZ
OL
and t
levels.
OHZ
are defined as the time at which the outputs achieve the open circuit condition and are not referenced to V
High-Z
High-Z
t
t
AS(4)
AS(4)
(OE=Low Fixed)
(OE= Clock)
IL.
t
OHZ(6)
- 6 -
HZ
t
(Max.) is less than t
WHZ(6)
t
t
AW
AW
t
t
CW(3)
CW(3)
t
t
WC
WC
t
t
WP1(2)
WP(2)
High-Z(8)
High-Z(8)
LZ
(Min.) both for a given device and from device to
Valid Data
Valid Data
t
t
DW
DW
PRELIMINARY
t
t
t
t
WR(5)
WR(5)
DH
DH
t
OW
CMOS SRAM
PRELIMINARY
September 2001
(10)
Revision 3.0
(9)
OH
or

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