M36L0R7050B0ZAQE STMICROELECTRONICS [STMicroelectronics], M36L0R7050B0ZAQE Datasheet - Page 12

no-image

M36L0R7050B0ZAQE

Manufacturer Part Number
M36L0R7050B0ZAQE
Description
128 Mbit (Multiple Bank, Multi-Level, Burst) Flash Memory 32 Mbit (2M x16) PSRAM, 1.8V Supply Multi-Chip Package
Manufacturer
STMICROELECTRONICS [STMicroelectronics]
Datasheet
M36L0R7050T0, M36L0R7050B0
DC AND AC PARAMETERS
This section summarizes the operating measure-
ment conditions, and the DC and AC characteris-
tics of the device. The parameters in the DC and
AC characteristics Tables that follow, are derived
from tests performed under the Measurement
Table 5. Operating and AC Measurement Conditions
Figure 5. AC Measurement I/O Waveform
Note: V
Table 6. Device Capacitance
Note: Sampled only, not 100% tested.
12/18
V
V
V
V
environment)
V
environment)
Ambient Operating Temperature
Load Capacitance (C
Output Circuit Resistors (R
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
DDF
DDP
DDQ
PPF
PPF
V DDQ
Symbol
C
Supply Voltage
DDQ
Supply Voltage
Supply Voltage
0V
Supply Voltage (Factory
Supply Voltage (Application
C
OUT
IN
= V
DDP
.
Parameter
Input Capacitance
Output Capacitance
L
)
Parameter
1
, R
2
)
V DDQ /2
AI06161
–0.4
Min
–25
1.7
1.7
8.5
Test Condition
Flash Memory
V
V
OUT
0 to V
IN
V
16.7
DDQ
= 0V
30
= 0V
Conditions summarized in
AC Measurement
check that the operating conditions in their circuit
match the operating conditions when relying on
the quoted parameters.
Figure 6. AC Measurement Load Circuit
0.1µF
DDQ
/2
V
V
DDQ
DDF
Max
1.95
1.95
12.6
85
5
+0.4
0.1µF
V
DDQ
C
L
Min
includes JIG capacitance
Conditions. Designers should
DEVICE
UNDER
Min
–30
1.7
TEST
5
0 to V
PSRAM
V
Table 5., Operating and
16.7
DDQ
50
Max
12
15
DDQ
/2
V
DDQ
C
Max
1.95
R
85
L
1
Unit
pF
pF
AI08364B
R
2
Unit
k
°C
pF
ns
V
V
V
V
V
V
V

Related parts for M36L0R7050B0ZAQE