AS7C33128PFS18B-133TQC ALSC [Alliance Semiconductor Corporation], AS7C33128PFS18B-133TQC Datasheet - Page 16

no-image

AS7C33128PFS18B-133TQC

Manufacturer Part Number
AS7C33128PFS18B-133TQC
Description
3.3V 128K x 18 pipeline burst synchronous SRAM
Manufacturer
ALSC [Alliance Semiconductor Corporation]
Datasheet
AC test conditions
12/10/04; v.1.4
Notes
1
2
3
4
5
6
7
8
+3.0V
GND
• Output load: see Figure B, except for t
• Input pulse level: GND to 3V. See Figure A.
• Input rise and fall time (measured at 0.3V and 2.7V): 2 ns. See Figure A.
• Input and output timing reference levels: 1.5V.
For test conditions, see AC Test Conditions, Figures A, B, C.
This parameter measured with output load condition in Figure C.
This parameter is sampled, but not 100% tested.
t
tCH measured as HIGH above VIH and tCL measured as LOW below VIL.
This is a synchronous device. All addresses must meet the specified setup and hold times for all rising edges of CLK. All other synchronous inputs
must meet the setup and hold times for all rising edges of CLK when chip is enabled.
Write refers to
Chip select refers to
HZOE
Figure A: Input waveform
10%
90%
is less than t
GWE, BWE, BW[a,b].
LZOE
CE0, CE1, CE2
; and t
90%
10%
HZC
is less than t
D
OUT
LZC
LZC
Alliance Semiconductor
Figure B: Output load (A)
, t
at any given temperature and voltage.
LZOE
Z
0
= 50Ω
, t
HZOE
, t
HZC
50Ω
30 pF*
, see Figure C.
V
®
L
for 3.3V I/O;
= V
for 2.5V I/O
= 1.5V
DDQ
/2
353Ω / 1538Ω
D
OUT
Figure C: Output load (B)
AS7C33128PFS18B
Thevenin equivalent:
319Ω / 1667Ω
5 pF*
GND
+3.3V for 3.3V I/O;
/+2.5V for 2.5V I/O
*including scope
and jig capacitance
P. 16 of 19

Related parts for AS7C33128PFS18B-133TQC