GAL22V10 Lattice Semiconductor, GAL22V10 Datasheet - Page 15
![no-image](/images/manufacturer_photos/0/3/381/lattice_semiconductor_sml.jpg)
GAL22V10
Manufacturer Part Number
GAL22V10
Description
High Performance E2CMOS PLD Generic Array Logic
Manufacturer
Lattice Semiconductor
Datasheet
1.GAL22V10.pdf
(29 pages)
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
GAL22V10-15LD/883
Manufacturer:
MOT
Quantity:
201
Company:
Part Number:
GAL22V10-15LD/883C
Manufacturer:
LATTICE
Quantity:
1 043
Company:
Part Number:
GAL22V10-15LNC
Manufacturer:
L
Quantity:
6 244
Company:
Part Number:
GAL22V10-15LP
Manufacturer:
IDT
Quantity:
210
Part Number:
GAL22V10-15LP
Manufacturer:
LATTICE
Quantity:
20 000
Company:
Part Number:
GAL22V10-15LVC
Manufacturer:
CYPRESS
Quantity:
9 410
Part Number:
GAL22V10-15LVC
Manufacturer:
NS/国半
Quantity:
20 000
3-state levels are measured 0.5V from steady-state active
level.
Output Load Conditions (except D-4) (see figure below)
Switching Test Conditions
Input Pulse Levels
Input Rise and
Fall Times
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
Test Condition
A
B
C
FROM OUTPUT (O/Q)
UNDER TEST
*C
Active High
Active Low
Active High
Active Low
L
INCLUDES TEST FIXTURE AND PROBE CAPACITANCE
D-4/-5/-7, C-5
D-10/-15/-20/-25
B & C-7/-10
B-15/-20/-25 3ns
R
2
300
300
300
R
+5V
1
R
1
390
390
390
390
390
1.5ns 10% – 90%
2.0ns 10% – 90%
R
2
GND to 3.0V
C *
10% – 90%
See Figure
L
1.5V
1.5V
TEST POINT
50pF
50pF
50pF
5pF
5pF
C
L
15
GAL22V10D-4 Output Load Conditions (see figure below)
FROM OUTPUT (O/Q)
UNDER TEST
Test Condition
A
B
C
Specifications GAL22V10
Z to Active High at 1.9V
Z to Active Low at 1.0V
Active High to Z at 1.9V
Active Low to Z at 1.0V
TEST POINT
Z
0
= 50 , C
50
50
50
50
50
R
1
L
*
50pF
50pF
50pF
50pF
50pF
C
+1.45V
L
R
1