AT28HC256E ATMEL Corporation, AT28HC256E Datasheet - Page 5

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AT28HC256E

Manufacturer Part Number
AT28HC256E
Description
256 32K x 8 High Speed Parallel EEPROMs
Manufacturer
ATMEL Corporation
Datasheet

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AC Read Characteristics
AC Read Waveforms
Notes:
Input Test Waveforms and
Measurement Level
Pin Capacitance
f = 1 MHz, T = 25°C
Note:
t
t
t
t
t
Symbol
C
C
ACC
CE
OE
DF
OH
Symbol
IN
OUT
t
(1)
(3)(4)
(2)
R
, t
F
1. CE may be delayed up to t
2. OE may be delayed up to t
3. t
4. This parameter is characterized and is not 100% tested.
1. This parameter is characterized and is not 100% tested.
< 5 ns
without impact on t
DF
Address to Output Delay
CE to Output Delay
OE to Output Delay
CE or OE to Output Float
Output Hold from OE, CE or Address,
whichever occurred first
is specified from OE or CE whichever occurs first (C
(1)
Typ
4
8
Parameter
ACC
(1)(2)(3)(4)
.
ACC
CE
- t
- t
OE
CE
after the falling edge of CE without impact on t
after the address transition without impact on t
Max
12
Min
AT28HC256-70
6
0
0
0
L
= 5 pF).
Max
Output Test Load
70
70
35
35
Min
AT28C256-90
0
0
0
Units
pF
pF
CE
Max
ACC
90
90
40
40
or by t
.
ACC
AT28HC256-12
Min
- t
0
0
0
OE
after an address change
Conditions
V
V
Max
OUT
120
120
IN
50
50
= 0V
= 0V
Units
ns
ns
ns
ns
ns
5

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