LMP8358MA NSC [National Semiconductor], LMP8358MA Datasheet - Page 26

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LMP8358MA

Manufacturer Part Number
LMP8358MA
Description
Zero-Drift, Programmable Instrumentation Amplifier with Diagnostics
Manufacturer
NSC [National Semiconductor]
Datasheet

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Open Input
Figure 9
this type of fault use the 1/50 feature by setting MUX[1:0] to
10b to test the +IN pin or to 11b to test the −IN pin, POL to
0b, PIN to 1b to test the −IN pin, and G[2:0] to 010b for a gain
Input Shorted to V+ or V−
Figure 10
V−. To sense this fault, use the 1/50 feature by setting MUX
[1:0] to 10b to test the +IN pin or to 11b to test the −IN pin,
shows an example of an open input fault. To sense
shows an example of an input pin shorted to V+ or
FIGURE 10. Input Shorted to V+ or V−
FIGURE 9. Open Input
26
of 50, and inject 100µA current by setting CUR[2:0] = 101b
(5082x or 58C2x). Since the input is open the input pin will be
pulled to V+. With an overall gain of 1 the output will read 5V
for open input.
POL to 0b, and G[2:0] to 010b for a gain of 50 (0082x or
00C2x). This will give an overall gain of 1 and the output will
read either V+ or V− depending on whether the input pin is
shorted to V+ or V−.
300454b7
300454b8

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